E-LIB Suche - Ergebnisse für: Ciston, J

1

Characterization of the atomic-level structure of γ-alumina..:

Clauser, A.L. ; Sarfo, K. Oware ; Giulian, R....
Acta Materialia. 245 (2023) - p. 118609 , 2023

Link: https://doi.org/10.1016/..

2

Atomic Resolution Probing of Phase Transformations and Doma..:

Deng, Y ; Gammer, C ; Ciston, J...
Microscopy and Microanalysis. 25 (2019) S2 - p. 1850-1851 , 2019

Link: https://doi.org/10.1017/..

3

Rapid Simulation of Elemental Maps in Core-Loss Electron En..:

Brown, H. G. ; Findlay, S. D. ; Allen, L. J...
Microscopy and Microanalysis. 25 (2019) S2 - p. 574-575 , 2019

Link: https://doi.org/10.1017/..

4

Microstructure and Defect Characterization Using Advanced S..:

Miao, J. ; Casalena, L. ; Ciston, J....
Microscopy and Microanalysis. 25 (2019) S2 - p. 1834-1835 , 2019

Link: https://doi.org/10.1017/..

5

Structure Retrieval of Strongly Scattering Materials in the..:

Brown, H. G. ; Chen, Z. ; Weyland, M....
Microscopy and Microanalysis. 25 (2019) S2 - p. 76-77 , 2019

Link: https://doi.org/10.1017/..

6

Hard x-ray standing-wave photoemission insights into the st..:

Conlon, C. S. ; Conti, G. ; Nemšák, S....
Journal of Applied Physics. 126 (2019) 7 - p. , 2019

Link: https://doi.org/10.1063/..

7

Structure Retrieval at Atomic Resolution in the Presence of..:

Brown, H. G. ; Chen, Z. ; Weyland, M....
Physical Review Letters. 121 (2018) 26 - p. , 2018

Link: https://doi.org/10.1103/..

8

Nature of the metal-insulator transition in few-unit-cell-t..:

Golalikhani, M. ; Lei, Q. ; Chandrasena, R. U....
Nature Communications. 9 (2018) 1 - p. , 2018

Link: https://doi.org/10.1038/..

9

Three-Dimensional Polarization by Means of Scanning HOLZ-CB..:

dos Reis, Roberto ; Hsu, S-L ; Ophus, C...
Microscopy and Microanalysis. 24 (2018) S1 - p. 178-179 , 2018

Link: https://doi.org/10.1017/..

10

Practical aspects of diffractive imaging using an atomic-sc..:

Chen, Z. ; Weyland, M. ; Ercius, P....
Ultramicroscopy. 169 (2016) - p. 107-121 , 2016

Link: https://doi.org/10.1016/..

11

Revealing Point Defects in a Large-Scale Scanning Diffracti..:

dos Reis, R. ; Ophus, C. ; Ciston, J...
Microscopy and Microanalysis. 22 (2016) S3 - p. 470-471 , 2016

Link: https://doi.org/10.1017/..

12

Local and transient nanoscale strain mapping during in situ..:

Gammer, C. ; Kacher, J. ; Czarnik, C....
Applied Physics Letters. 109 (2016) 8 - p. , 2016

Link: https://doi.org/10.1063/..

13

Quantitative Structural Analysis of Complex Materials by Sc..:

Gammer, Christoph ; Özdöl, Burak V. ; Bustillo, Karen C...
Microscopy and Microanalysis. 22 (2016) S3 - p. 502-503 , 2016

Link: https://doi.org/10.1017/..

14

Nanoscale Strain Mapping During in situ Deformation of Anne..:

Pekin, T. C. ; Ciston, J. ; Gammer, C..
Microscopy and Microanalysis. 22 (2016) S3 - p. 522-523 , 2016

Link: https://doi.org/10.1017/..

15

Local strain measurements during in situ TEM deformation wi..:

Minor, A.M. ; Gammer, C. ; Deng, Y....
Microscopy and Microanalysis. 22 (2016) S3 - p. 710-711 , 2016

Link: https://doi.org/10.1017/..