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X
Cluzel, J
2099  Ergebnisse:
Personensuche X
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1

Accurate statistical extraction of AlGaN/GaN HEMT device pa..:

Kom Kammeugne, R. ; Leroux, C. ; Cluzel, J....
Solid-State Electronics.  184 (2021)  - p. 108078 , 2021
Link: https://doi.org/10.1016/..
 
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2

Poly(V3D3), an iCVD polymer with promising dielectric prope..:

Zavvou, C. ; Cluzel, J. ; Mariolle, D...
Solid-State Electronics.  184 (2021)  - p. 108057 , 2021
Link: https://doi.org/10.1016/..
 
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3

Comparative experimental study of junctionless and inversio..:

, In: 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Bosch, D. ; Colinge, J.P. ; Lugo, J.... - p. 126-127 , 2020
Link: https://doi.org/10.1109/..
 
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4

All-operation-regime characterization and modeling of drain..:

, In: 2020 IEEE Symposium on VLSI Technology,
Bosch, D. ; Colinge, J.P. ; Ghibaudo, G.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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5

Novel fine-grain back-bias assist techniques for 3D-monolit..:

Bosch, D. ; Garros, X. ; Makosiej, A....
Solid-State Electronics.  168 (2020)  - p. 107720 , 2020
Link: https://doi.org/10.1016/..
 
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6

Subduction erosion: contributions of footwall and hanging w..:

Cluzel, D.
Australian Journal of Earth Sciences.  68 (2020)  1 - p. 99-119 , 2020
Link: https://doi.org/10.1080/..
 
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7

Chapter 1 Introduction to New Caledonia: geology, geodynami..:

Maurizot, P. ; Robineau, B. ; Vendé-Leclerc, M..
Geological Society, London, Memoirs.  51 (2020)  1 - p. 1-12 , 2020
Link: https://doi.org/10.1144/..
 
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8

Back-bias impact on variability and BTI for 3D-monolithic 1..:

, In: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS),
Bosch, D. ; Andrieu, F. ; Garros, X.... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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9

Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Bosch, D. ; Andrieu, F. ; Ciampolini, L.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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10

Investigation of nBTI degradation on GaN-on-Si E-mode MOSc-..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Viey, A.G. ; Vandendaele, W. ; Jaud, M.-A.... - p. 4.3.1-4.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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11

A Very Robust and Reliable 2.7GHz +31dBm Si RFSOI Transisto..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Garros, X. ; Cacho, F. ; Vincent, E.... - p. 25.5.1-25.5.4 , 2019
Link: https://doi.org/10.1109/..
 
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12

In search of Gondwana heritage in the Outer Melanesian Arc:..:

Cluzel, D. ; Meffre, S.
Australian Journal of Earth Sciences.  66 (2018)  2 - p. 265-277 , 2018
Link: https://doi.org/10.1080/..
 
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13

Neogene terrestrial sediments: a record of the post-obducti..:

Folcher, N. ; Sevin, B. ; Quesnel, F....
Australian Journal of Earth Sciences.  62 (2015)  4 - p. 479-492 , 2015
Link: https://doi.org/10.1080/..
 
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14

Pre-obduction records of Eocene foreland basins in central ..:

Maurizot, P ; Cluzel, D
New Zealand Journal of Geology and Geophysics.  57 (2014)  3 - p. 300-311 , 2014
Link: https://doi.org/10.1080/..
 
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15

Accurate analysis of parasitic current overshoot during for..:

Tirano, S. ; Perniola, L. ; Buckley, J....
Microelectronic Engineering.  88 (2011)  7 - p. 1129-1132 , 2011
Link: https://doi.org/10.1016/..
 
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