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2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
2
Comparative experimental study of junctionless and inversio..:
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2020 IEEE Symposium on VLSI Technology ,
3
All-operation-regime characterization and modeling of drain..:
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2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ,
5
Back-bias impact on variability and BTI for 3D-monolithic 1..:
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2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ,
6
Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI..:
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2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) ,
7
Laser Processing For 3D Junctionless Transistor Fabrication:
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13
Semiconductor-on-insulator materials for nanoelectronics ap..
Engineering materials
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Zentrale:Magazinturm E02 a elt 020.2 m/526