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Copetti, Thiago S.
97  Ergebnisse:
Personensuche X
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1

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

, In: VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things; IFIP Advances in Information and Communication Technology,
Copetti, Thiago S. ; Medeiros, Guilherme C. ; Poehls, Letícia M. B.. - p. 22-45 , 2019
Link: https://doi.org/10.1007/..
 
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2

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

Copetti, Thiago, S ; Medeiros, Guilherme, C ; Poehls, Letícia.
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-15663-3_2.  , 2017
Link: https://inria.hal.scienc..
 
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3

Evaluating the Impact of Resistive Defects on FinFET-Based ..:

Copetti, Thiago, S ; Medeiros, Guilherme, C ; Poehls, Letícia.
info:eu-repo/semantics/altIdentifier/doi/10.1007/978-3-030-15663-3_2.  , 2017
Link: https://inria.hal.scienc..
 
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4

Evaluating the Impact of Process Variation on RRAMs:

Brum, E ; Fieback, M ; Santos Copetti, Thiago...
info:eu-repo/semantics/altIdentifier/wos/WOS:000923746100009.  , 2021
Link: https://publications.rwt..
 
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5

Improving the Detection of Undefined State Faults in FinFET..:

Medeiros, G. C ; Fieback, M ; Santos Copetti, Thiago...
info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-3654-0.  , 2021
Link: https://publications.rwt..
 
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6

A DfT Strategy for Guaranteeing ReRAM's Quality after Manuf..:

Copetti, T. S. ; Fieback, M. ; Gemmeke, T...
Journal of Electronic Testing.  40 (2024)  2 - p. 245-257 , 2024
Link: https://doi.org/10.1007/..
 
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7

Analyzing the Use of Temperature to Facilitate Fault Propag..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Copetti, T. S. ; Chordia, A. ; Fieback, M.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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8

Evaluating a New RRAM Manufacturing Test Strategy:

, In: 2023 IEEE 24th Latin American Test Symposium (LATS),
Copetti, T. S. ; Castelnuovo, A. ; Gemmeke, T.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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9

A DfT Strategy for Detecting Emerging Faults in RRAMs:

, In: VLSI-SoC: Technology Advancement on SoC Design; IFIP Advances in Information and Communication Technology,
Copetti, Thiago Santos ; Gemmeke, Tobias ; Poehls, Leticia Maria Bolzani - p. 93-111 , 2022
Link: https://doi.org/10.1007/..
 
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10

Exploring an On-Chip Sensor to Detect Unique Faults in RRAM:

, In: 2022 IEEE 23rd Latin American Test Symposium (LATS),
Copetti, T. S. ; Nilovic, M. ; Fieback, M.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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11

Evaluating the Impact of Process Variation on RRAMs:

, In: 2021 IEEE 22nd Latin American Test Symposium (LATS),
Brum, E. ; Fieback, M. ; Copetti, T. S.... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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12

Identification and Rejuvenation of NBTI-Critical Logic Path..:

Jenihhin, Maksim ; Squillero, Giovanni ; Copetti, Thiago Santos...
Journal of Electronic Testing.  32 (2016)  3 - p. 273-289 , 2016
Link: https://doi.org/10.1007/..
 
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13

Characterization and Test of Intermittent Over RESET in RRA..:

, In: 2023 IEEE 32nd Asian Test Symposium (ATS),
Xun, Hanzhi ; Fieback, Moritz ; Yuan, Sicong... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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14

Evaluation of Single Event Upset Susceptibility of FinFET-b..:

Copetti, Thiago ; Cardoso Medeiros, Guilherme ; Taouil, Mottaqiallah...
Journal of Electronic Testing.  37 (2021)  3 - p. 383-394 , 2021
Link: https://doi.org/10.1007/..
 
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15

Evaluating the Impact of Ionizing Particles on FinFET -base..:

, In: 2020 IEEE Latin-American Test Symposium (LATS),
Copetti, Thiago ; Medeiros, Guilherme Cardoso ; Taouil, Mottaqiallah... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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