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VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things; IFIP Advances in Information and Communication Technology ,
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Evaluating the Impact of Resistive Defects on FinFET-Based ..:
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2024 IEEE 25th Latin American Test Symposium (LATS) ,
7
Analyzing the Use of Temperature to Facilitate Fault Propag..:
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2023 IEEE 24th Latin American Test Symposium (LATS) ,
8
Evaluating a New RRAM Manufacturing Test Strategy:
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VLSI-SoC: Technology Advancement on SoC Design; IFIP Advances in Information and Communication Technology ,
9
A DfT Strategy for Detecting Emerging Faults in RRAMs:
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2022 IEEE 23rd Latin American Test Symposium (LATS) ,
10
Exploring an On-Chip Sensor to Detect Unique Faults in RRAM:
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2021 IEEE 22nd Latin American Test Symposium (LATS) ,
11
Evaluating the Impact of Process Variation on RRAMs:
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2023 IEEE 32nd Asian Test Symposium (ATS) ,
13
Characterization and Test of Intermittent Over RESET in RRA..:
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2020 IEEE Latin-American Test Symposium (LATS) ,
15