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Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design (IEEE Cat. No.04TH8784) ,
10
A multi-level approach to the dependability analysis of net..:
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Proceedings of the 17th symposium on Integrated circuits and system design ,
12
A multi-level approach to the dependability analysis of net..:
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Proceedings of the 2003 ACM symposium on Applied computing ,
14
Automatic test program generation for pipelined processors:
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Proceedings of the conference on Design, Automation and Test in Europe - Volume 1 ,
15