E-LIB Suche - Ergebnisse für: Cristiano, Filadelfo

1

Growth of BiSb on GaAs (001) and (111)A surfaces: A joint e..:

Sadek, Dima ; Jay, Antoine ; El Hila, Jihan...
Applied Surface Science. 622 (2023) - p. 156688 , 2023

Link: https://doi.org/10.1016/..

2

β‐Disubstituted Pentacene Derivatives: Thin Film Structural..:

Aliouat, Mouaad‐Yassine ; Cristiano, Filadelfo ; Abbassi, Lydia...
ChemPlusChem. 89 (2023) 4 - p. , 2023

Link: https://doi.org/10.1002/..

3

Large-Scale Monolithic Fabrication of III–V Vertical Nanowi..:

Lecestre, Aurélie ; Martin, Mickael ; Cristiano, Filadelfo..
ACS Omega. 7 (2022) 7 - p. 5836-5843 , 2022

Link: https://doi.org/10.1021/..

4

Hyper-Doped Silicon Nanoantennas and Metasurfaces for Tunab..:

Poumirol, Jean-Marie ; Majorel, Clément ; Chery, Nicolas...
ACS Photonics. 8 (2021) 5 - p. 1393-1399 , 2021

Link: https://doi.org/10.1021/..

5

An Improved STEM/EDX Quantitative Method for Dopant Profili..:

Makarem, Raghda ; Cristiano, Filadelfo ; Muller, Dominique.
Microscopy and Microanalysis. 26 (2020) 1 - p. 76-85 , 2020

Link: https://doi.org/10.1017/..

6

Insight of surface treatments for CMOS compatibility of InA..:

Dhungana, Daya S. ; Hemeryck, Anne ; Sartori, Nicolo...
Nano Research. 12 (2018) 3 - p. 581-586 , 2018

Link: https://doi.org/10.1007/..

7

A differential Hall effect measurement method with sub-nano..:

Daubriac, Richard ; Scheid, Emmanuel ; Rizk, Hiba...
Beilstein Journal of Nanotechnology. 9 (2018) - p. 1926-1939 , 2018

Link: https://doi.org/10.3762/..

8

Controlling nanowire nucleation for integration on silicon:

, In: 2016 IEEE Nanotechnology Materials and Devices Conference (NMDC),

Dhungana, Daya S. ; Sartori, Nicolo ; Mallet, Nicolas... - p. 1-2 , 2016

Link: https://doi.org/10.1109/..

9

Kinetic Monte Carlo simulations of boron activation in impl..:

Fisicaro, Giuseppe ; Pelaz, Lourdes ; Aboy, Maria...
Applied Physics Express. 7 (2014) 2 - p. 021301 , 2014

Link: https://doi.org/10.7567/..

10

Overlayer stress effects on defect formation in Si and Ge:

Cowern, Nick E.B. ; Bennett, Nick S. ; Ahn, Chihak...
Thin Solid Films. 518 (2010) 9 - p. 2442-2447 , 2010

Link: https://doi.org/10.1016/..

11

Detailed arsenic concentration profiles at Si/SiO2 interfac..:

Pei, Lirong ; Duscher, Gerd ; Steen, Christian...
Journal of Applied Physics. 104 (2008) 4 - p. , 2008

Link: https://doi.org/10.1063/..

12

A physically based model for the spatial and temporal evolu..:

Ortiz, Christophe J. ; Pichler, Peter ; Fühner, Tim...
Journal of Applied Physics. 96 (2004) 9 - p. 4866-4877 , 2004

Link: https://doi.org/10.1063/..

13

Thermal evolution of extended defects in implanted Si:

Claverie, Alain ; Colombeau, Benjamin ; Ben Assayag, Gérard...
Materials Science in Semiconductor Processing. 3 (2000) 4 - p. 269-277 , 2000

Link: https://doi.org/10.1016/..

14

Transmission Electron Microscopy and Spectroscopic Ellipsom..:

He, Zhiping ; Cristiano, Filadelfo ; Zhou, Zuyao...
Journal of The Electrochemical Society. 143 (1996) 8 - p. 2636-2640 , 1996

Link: https://doi.org/10.1149/..

15

Growth of BiSb on GaAs (001) and (111)A surfaces: A joint e..:

Sadek, Dima ; Jay, Antoine ; El Hila, Jihan...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.apsusc.2023.156688. , 2023

Link: https://laas.hal.science..