Croci, Tommaso
55  Ergebnisse:
Personensuche X
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2

TCAD modelling of a-Si:H devices for particle detection app..:

Passeri, Daniele ; Morozzi, Arianna ; Fabi, Michele...
Materials Science in Semiconductor Processing.  169 (2024)  - p. 107870 , 2024
 
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6

TCAD modeling of bulk radiation damage effects in silicon d..:

Asenov, Patrick ; Arcidiacono, Roberta ; Cartiglia, Nicolo...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1040 (2022)  - p. 167180 , 2022
 
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8

Advanced Radiation Sensors VLSI Design in CMOS Technology f..:

, In: Lecture Notes in Electrical Engineering; Applications in Electronics Pervading Industry, Environment and Society,
 
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9

Depleted MAPS on a 110 nm CMOS CIS Technology:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
 
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13

Depleted MAPS on a 110 nm CMOS CIS Technology:

GIAMPAOLO, RAFFAELE AARON ; Di Salvo, Andrea ; Pancheri, Lucio...
info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-0996-1.  , 2019
 
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15

TCAD Modeling of Surface Radiation Damage Effects: A State-..:

Arianna Morozzi ; Francesco Moscatelli ; Tommaso Croci.
https://www.frontiersin.org/articles/10.3389/fphy.2021.617322/full.  , 2021
 
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