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Noise in Nanoscale Semiconductor Devices ,
1
An Overview on Statistical Modeling of Random Telegraph Noi..:
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3
Matching properties of deep sub-micron MOS transistors
Kluwer international series in engineering and computer science ; 851
Exemplar:
Zentrale: a elt 676 e/388
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Proceedings of the 14th Learning Analytics and Knowledge Conference ,
8
Feedback, Control, or Explanations? Supporting Teachers Wit..:
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Proceedings of the Annual Symposium on Computer-Human Interaction in Play ,
10