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X
Cui, Bardon
11  Ergebnisse:
Personensuche X
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1

Failure Analysis for SIP IC EOS fail:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Cui, Bardon ; You, Qiquan - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Failure Analysis for SIP IC after TC reliability test:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Cui, Bardon - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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3

Evidence for the leptonic decay D→μν:

Bai, J.Z ; Bardon, O ; Blum, I...
Physics Letters B.  429 (1998)  1-2 - p. 188-194 , 1998
Link: https://doi.org/10.1016/..
 
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4

Direct Measurement of the Pseudoscalar Decay Constant,fDs:

Bai, J. Z. ; Bardon, O. ; Blum, I....
Physical Review Letters.  74 (1995)  23 - p. 4599-4602 , 1995
Link: https://doi.org/10.1103/..
 
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5

Measurement of the mass of the τ lepton:

Bai, J. Z. ; Bardon, O. ; Becker-Szendy, R. A....
Physical Review Letters.  69 (1992)  21 - p. 3021-3024 , 1992
Link: https://doi.org/10.1103/..
 
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6

Direct measurement of B(Ds+→φX+):

Bai, JZ ; Bardon, O ; Blum, I...
qt26v5895t.  , 1998
Link: https://escholarship.org..
 
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7

Evidence for the leptonic decay D→μνμ:

Bai, JZ ; Bardon, O ; Blum, I...
qt3fs1n5fm.  , 1998
Link: https://escholarship.org..
 
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8

Measurement of the branching fraction of Ds inclusive semil..:

Bai, JZ ; Bardon, O ; Bian, JG...
qt8503f8s3.  , 1997
Link: https://escholarship.org..
 
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9

Measurement of the mass of the τ lepton:

Bai, JZ ; Bardon, O ; Becker-Szendy, RA...
qt3835g0dc.  , 1996
Link: https://escholarship.org..
 
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10

Search for a vector glueball by a scan of the Jψ resonance:

Bai, JZ ; Bardon, O ; Blum, I...
qt2wz4997c.  , 1996
Link: https://escholarship.org..
 
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11

Direct Measurement of the Pseudoscalar Decay Constant, fDs:

Bai, JZ ; Bardon, O ; Blum, I...
qt3637r7f6.  , 1995
Link: https://escholarship.org..
 
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