E-LIB Suche - Ergebnisse für: Dändliker, R.

1

Selective coupling of and modes into microfabricated fully ..:

Tortora, P. ; Descrovi, E. ; Aeschimann, L....
Ultramicroscopy. 107 (2007) 2-3 - p. 158-165 , 2007

Link: https://doi.org/10.1016/..

2

Detection of non-paraxial optical fields by optical fiber t..:

Tortora, P. ; Dändliker, R. ; Nakagawa, W..
Optics Communications. 259 (2006) 2 - p. 876-882 , 2006

Link: https://doi.org/10.1016/..

3

Propagation of the electromagnetic field in fully coated ne..:

Vaccaro, L. ; Aeschimann, L. ; Staufer, U...
Applied Physics Letters. 83 (2003) 3 - p. 584-586 , 2003

Link: https://doi.org/10.1063/..

4

Measuring amplitude and phase distribution of fields genera..:

Nesci, A. ; Dändliker, R. ; Salt, M..
Optics Communications. 205 (2002) 4-6 - p. 229-238 , 2002

Link: https://doi.org/10.1016/..

5

Detection of movement with laser speckle patterns: statisti..:

Schnell, U. ; Piot, J. ; Dändliker, R.
Journal of the Optical Society of America A. 15 (1998) 1 - p. 207 , 1998

Link: https://doi.org/10.1364/..

6

Scanning near-field optical microscopy: transfer function a..:

Blattner, P. ; Herzig, H.P. ; Dändliker, R.
Optics Communications. 155 (1998) 4-6 - p. 245-250 , 1998

Link: https://doi.org/10.1016/..

7

Distance measurement by multiple-wavelength interferometry:

Dändliker, R ; Salvadé, Y ; Zimmermann, E
Journal of Optics. 29 (1998) 3 - p. 105-114 , 1998

Link: https://doi.org/10.1088/..

8

Microlens lithography and smart masks:

Völkel, R. ; Herzig, H.P. ; Nussbaum, Ph....
Microelectronic Engineering. 35 (1997) 1-4 - p. 513-516 , 1997

Link: https://doi.org/10.1016/..

9

Pure phase correlator with photorefractive filter memory:

Duelli, M. ; Pourzand, A. R. ; Collings, N..
Optics Letters. 22 (1997) 2 - p. 87 , 1997

Link: https://doi.org/10.1364/..

10

Stabilized three-wavelength source calibrated by electronic..:

Zimmermann, E. ; Salvadé, Y. ; Dändliker, R.
Optics Letters. 21 (1996) 7 - p. 531 , 1996

Link: https://doi.org/10.1364/..

11

Microlens lithography: A new approach for large display fab..:

Völkel, R. ; Herzig, H.P. ; Nussbaum, Ph....
Microelectronic Engineering. 30 (1996) 1-4 - p. 107-110 , 1996

Link: https://doi.org/10.1016/..

12

Multiple-Wavelength and White-Light Interferometry:

, In: Laser in Forschung und Technik / Laser in Research and Engineering,

Dändliker, R. ; Zimmermann, E. ; Schnell, U.. - p. 425-437 , 1996

Link: https://doi.org/10.1007/..

13

Dispersive white-light interferometry for absolute distance..:

Schnell, U. ; Gray, S. ; Dändliker, R.
Optics Letters. 21 (1996) 7 - p. 528 , 1996

Link: https://doi.org/10.1364/..

14

Improvement of speckle statistics in double-wavelength supe..:

Dändliker, R. ; Geiser, M. ; Giunti, C...
Applied Optics. 34 (1995) 31 - p. 7197 , 1995

Link: https://doi.org/10.1364/..

15

Absolute distance measurement with synchronously sampled wh..:

Schnell, U ; Zimmermann, E ; Dandliker, R
Pure and Applied Optics: Journal of the European Optical Society Part A. 4 (1995) 5 - p. 643-651 , 1995

Link: https://doi.org/10.1088/..