Dadouch, S.
20  Ergebnisse:
Personensuche X
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2

Electron Emission Yield of Metals: In-Situ Cleaned and Expo..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Belhaj, M. ; Dadouch, S. - p. 1-1 , 2023
 
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3

Experimental Study of the Effect of Temperature Dependent C..:

, In: 2022 IEEE International Conference on Plasma Science (ICOPS),
Gibaru, Q. ; Belhaj, M. ; Inguimbert, C.... - p. 1-2 , 2022
 
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4

Effect of the Angle of Incidence of Electrons on the Electr..:

, In: 2022 IEEE International Conference on Plasma Science (ICOPS),
Pacaud, R. ; Belhaj, M. ; Dadouch, S... - p. 1-1 , 2022
 
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5

Experimental Study Of The Effect Of The Temperature On The ..:

, In: 2022 IEEE International Conference on Plasma Science (ICOPS),
Belhaj, M. ; Dadouch, S. ; Pacaud, R... - p. 1-1 , 2022
 
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6

A simple method for energy calibration of keV incident elec..:

Belhaj, M. ; Dadouch, S.
Review of Scientific Instruments.  92 (2021)  8 - p. , 2021
 
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8

Rational Engineering of the Dielectric Properties of Thin S..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Rigoudy, C. ; Makasheva, K. ; Belhaj, M.... - p. 205-208 , 2020
 
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10

Low Energy Electron Irradiation Induced Charging of Dielect..:

, In: 2019 IEEE Pulsed Power & Plasma Science (PPPS),
Belhaj, M. ; Dadouch, S. - p. 1-3 , 2019
 
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11

Study of required conditions to limit the dielectric chargi..:

Rigoudy, Charles ; Makasheva, Kremena ; Teyssedre, G...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICD.2018.8468360.  , 2018
 
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12

Study of required conditions to limit the dielectric chargi..:

Rigoudy, Charles ; Makasheva, Kremena ; Teyssedre, G...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICD.2018.8468360.  , 2018
 
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13

Study of required conditions to limit the dielectric chargi..:

Rigoudy, Charles ; Makasheva, Kremena ; Teyssedre, G...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICD.2018.8468360.  , 2018
 
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14

On the secondary electron emission phenomenon when originat..:

Makasheva, Kremena ; Belhaj, M ; Teyssedre, G...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NANO.2017.8117275.  , 2017
 
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15

On the secondary electron emission phenomenon when originat..:

Makasheva, Kremena ; Belhaj, M ; Teyssedre, G...
info:eu-repo/semantics/altIdentifier/doi/10.1109/NANO.2017.8117275.  , 2017
 
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