E-LIB Suche - Ergebnisse für: Danilewsky, A.

1

Correlated Three-Dimensional Imaging of Dislocations: Insig..:

Hänschke, D. ; Danilewsky, A. ; Helfen, L...
Physical Review Letters. 119 (2017) 21 - p. , 2017

Link: https://doi.org/10.1103/..

2

Non-destructive laboratory-based X-ray diffraction mapping ..:

Wong, C.S. ; Bennett, N.S. ; Manessis, D...
Microelectronic Engineering. 117 (2014) - p. 48-56 , 2014

Link: https://doi.org/10.1016/..

3

Three-dimensional imaging of dislocations by X-ray diffract..:

Hänschke, D. ; Helfen, L. ; Altapova, V...
Applied Physics Letters. 101 (2012) 24 - p. , 2012

Link: https://doi.org/10.1063/..

4

Investigation of crystallographic and detection properties ..:

Cecilia, A ; Hamann, E ; Haas, C...
Journal of Instrumentation. 6 (2011) 10 - p. P10016-P10016 , 2011

Link: https://doi.org/10.1088/..

5

Dislocation generation related to micro-cracks in Si wafers..:

Danilewsky, A. ; Wittge, J. ; Hess, A....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 268 (2010) 3-4 - p. 399-402 , 2010

Link: https://doi.org/10.1016/..

6

X-ray diffraction imaging of dislocation generation related..:

Wittge, J. ; Danilewsky, A. ; Allen, D....
Powder Diffraction. 25 (2010) 2 - p. 99-103 , 2010

Link: https://doi.org/10.1154/..

7

Study of the influence of the rare-earth elements on the pr..:

Matuchova, M. ; Zdansky, K. ; Zavadil, J....
Journal of Crystal Growth. 311 (2009) 14 - p. 3557-3562 , 2009

Link: https://doi.org/10.1016/..

8

Phase equilibria, crystal growth and characterization of th..:

Muehlberg, M. ; Burianek, M. ; Joschko, B....
Journal of Crystal Growth. 310 (2008) 7-9 - p. 2288-2294 , 2008

Link: https://doi.org/10.1016/..

9

An X-Ray Topographic Analysis of the Crystal Quality of Glo..:

Brazil, I. ; McNally, Patrick J. ; Ren, N....
Materials Science Forum. 556-557 (2007) - p. 227-230 , 2007

Link: https://doi.org/10.4028/..

10

Dislocations in GaAs p-i-n diodes grown by hydride vapour p..:

Säynätjoki, A. ; Lankinen, A. ; Tuomi, T. O....
Journal of Materials Science: Materials in Electronics. 19 (2007) 2 - p. 149-154 , 2007

Link: https://doi.org/10.1007/..

11

Synchrotron X-ray topographic study of dislocations and sta..:

Lankinen, A. ; Tuomi, T. ; Riikonen, J....
Journal of Crystal Growth. 283 (2005) 3-4 - p. 320-327 , 2005

Link: https://doi.org/10.1016/..

12

Synchrotron X-ray topography study of defects in indium ant..:

Riikonen, J. ; Tuomi, T. ; Lankinen, A....
Journal of Materials Science: Materials in Electronics. 16 (2005) 7 - p. 449-453 , 2005

Link: https://doi.org/10.1007/..

13

Book Review: Tensor Properties of Crystal. By D. R. Lovett:

Danilewsky, A.
Crystal Research and Technology. 37 (2002) 1 - p. 142-142 , 2002

Link: https://doi.org/10.1002/..

14

An evaluation of liquid phase epitaxial InGaAs/InAs heteros..:

McNally, Patrick J ; Curley, J ; Krier, A...
Semiconductor Science and Technology. 13 (1998) 4 - p. 345-349 , 1998

Link: https://doi.org/10.1088/..

15

GaSb: surface tension and floating-zone growth:

Tegetmeier, A. ; Cröll, A. ; Danilewsky, A..
Journal of Crystal Growth. 166 (1996) 1-4 - p. 651-656 , 1996

Link: https://doi.org/10.1016/..