Das, Debesh K.
89  Ergebnisse:
Personensuche X
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1

Easily-Verifiable Design of Non-Scan Sequential Machines fo..:

, In: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID),
 
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2

Design of All Optical Binary Comparator:

, In: Advanced Techniques for IoT Applications; Lecture Notes in Networks and Systems,
Roy, Sayantani ; Das, Debesh K. - p. 582-589 , 2021
 
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5

Detailed Fault Model for Physical Quantum Circuits:

, In: 2019 IEEE 28th Asian Test Symposium (ATS),
Deb, Arighna ; Das, Debesh K. - p. 153-1535 , 2019
 
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6

Delay Efficient All Optical Carry Lookahead Adder:

, In: Communications in Computer and Information Science; VLSI Design and Test,
Roy, Sayantani ; Deb, Arighna ; Das, Debesh K. - p. 236-244 , 2019
 
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7

An iterative structure for synthesizing symmetric functions..:

Deb, Arighna ; Das, Debesh K.
Microprocessors and Microsystems.  53 (2017)  - p. 157-167 , 2017
 
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9

Reversible Synthesis of Symmetric Functions with a Simple R..:

Deb, Arighna ; Das, Debesh K. ; Rahaman, Hafizur...
ACM Journal on Emerging Technologies in Computing Systems.  12 (2016)  4 - p. 1-29 , 2016
 
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10

Reversible Synthesis of Symmetric Functions with a Simple R..:

Deb, Arighna ; Das, Debesh K. ; Rahaman, Hafizur...
ACM Journal on Emerging Technologies in Computing Systems (JETC).  12 (2016)  4 - p. 1-29 , 2016
 
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12

Derivation of test set for detecting multiple missing-gate ..:

Kole, Dipak K. ; Rahaman, Hafizur ; Das, Debesh K..
Computers & Electrical Engineering.  39 (2013)  2 - p. 225-236 , 2013
 
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13

Reversible synthesis of symmetric boolean functions based o..:

, In: Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI,
Deb, Arighna ; Das, Debesh K. ; Rahaman, Hafizur. - p. 351-352 , 2013
 
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14

Fault diagnosis in reversible circuits under missing-gate f..:

Rahaman, Hafizur ; Kole, Dipak K. ; Das, Debesh K..
Computers & Electrical Engineering.  37 (2011)  4 - p. 475-485 , 2011
 
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15

Notice of Removal: Synthesis of online testable reversible ..:

, In: 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems,
 
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