E-LIB Suche - Ergebnisse für: De Souza, Michelly

1

Comprehensive evaluation of gate-induced drain leakage in S..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics. 214 (2024) - p. 108865 , 2024

2

Analytical model for the drain and gate currents in silicon..:

Cerdeira, Antonio ; Estrada, Magali ; de Souza, Michelly.
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 37 (2024) 2 - p. , 2024

Link: https://doi.org/10.1002/..

3

Experimental Comparison of Threshold Voltage Extraction Met..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),

Prates, Vinicius Rodrigues ; Pavanello, Marcelo Antonio ; de Souza, Michelly - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

4

Comparative of analog performance of transcapacitances in a..:

Alves, Camila Restani ; de Souza, Michelly
Journal of Computational Electronics. , 2023

Link: https://doi.org/10.1007/..

5

Electrical Characterization of Ω-Gate Nanowire MOSFETs Down..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),

Matos, Jefferson Almeida ; de Souza, Michelly ; Casse, Mikael... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

6

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

7

Experimental assessment of gate-induced drain leakage in SO..:

de Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
Solid-State Electronics. 208 (2023) - p. 108716 , 2023

Link: https://doi.org/10.1016/..

8

High Temperature and Width Influence on the GIDL of Nanowir..:

De Souza, Michelly ; Cerdeira, Antonio ; Estrada, Magali...
IEEE Journal of the Electron Devices Society. 11 (2023) - p. 672-680 , 2023

Link: https://doi.org/10.1109/..

9

Impact of series resistance on the drain current variabilit..:

da Silva, Lucas Mota Barbosa ; Pavanello, Marcelo Antonio ; Cassé, Mikaël...
Solid-State Electronics. 208 (2023) - p. 108737 , 2023

Link: https://doi.org/10.1016/..

10

(Digital Presentation) Comparison of Width and Temperature ..:

Pizzanelli, Riccardo ; Prates, Rhaycen ; Pavanello, Marcelo Antonio.
ECS Transactions. 111 (2023) 1 - p. 291-296 , 2023

Link: https://doi.org/10.1149/..

11

Performance of SOI Ω-Gate Nanowires fromCryogenic to High T..:

Pavanello, Marcelo Antonio ; De Souza, Michelly
Journal of Integrated Circuits and Systems. 17 (2022) 2 - p. 1-8 , 2022

Link: https://doi.org/10.29292..

12

An Experimental Evaluation of Fin Width and Low-Temperature..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),

de Souza, Michelly ; Rodrigues, Jaime Calcade ; Mariniello, Genaro... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

13

Analysis of Variability in Transconductance and Mobility of..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),

Barbosa da Silva, Lucas Mota ; Pavanello, Marcelo Antonio ; Casse, Mikael... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

14

Comparative Analysis of Transcapacitances in Asymmetric Sel..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),

Alves, Camila Restani ; d'Oliveira, Ligia Martins ; de Souza, Michelly - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

15

Variability Modeling in Triple-Gate Junctionless Nanowire T..:

Trevisoli, Renan ; Pavanello, Marcelo A. ; Doria, Rodrigo T....
IEEE Transactions on Electron Devices. 69 (2022) 8 - p. 4730-4736 , 2022

Link: https://doi.org/10.1109/..