E-LIB Suche - Ergebnisse für: Defferriere, Thomas

1

Ionic Conduction‐Based Polycrystalline Oxide Gamma Ray Dete..:

Defferriere, Thomas ; Helal, Ahmed Sami ; Li, Ju..
Advanced Materials. 36 (2024) 24 - p. , 2024

Link: https://doi.org/10.1002/..

2

Ionic Conduction‐Based Polycrystalline Oxide Gamma Ray Dete..:

Defferriere, Thomas ; Helal, Ahmed Sami ; Li, Ju..
Advanced Materials. 36 (2024) 24 - p. , 2024

Link: https://doi.org/10.1002/..

3

High-temperature chemical expansion of Pr0.1Ce0.9O2-δ thin ..:

Kohlmann, Dhyan ; Wulfmeier, Hendrik ; Schewe, Marvin...
Solid State Ionics. 392 (2023) - p. 116151 , 2023

Link: https://doi.org/10.1016/..

4

Silica: ubiquitous poison of metal oxide interfaces:

Staerz, Anna ; Seo, Han Gil ; Defferriere, Thomas.
Journal of Materials Chemistry A. 10 (2022) 6 - p. 2618-2636 , 2022

Link: https://doi.org/10.1039/..

5

Photo-enhanced ionic conductivity across grain boundaries i..:

Defferriere, Thomas ; Klotz, Dino ; Gonzalez-Rosillo, Juan Carlos..
Nature Materials. 21 (2022) 4 - p. 438-444 , 2022

Link: https://doi.org/10.1038/..

6

Impact of Oxygen Non‐Stoichiometry on Near‐Ambient Temperat..:

Defferriere, Thomas ; Kalaev, Dmitri ; Rupp, Jennifer L. M..
Advanced Functional Materials. 31 (2021) 14 - p. , 2021

Link: https://doi.org/10.1002/..

7

Thin-film chemical expansion of ceria based solid solutions..:

Wulfmeier, Hendrik ; Kohlmann, Dhyan ; Defferriere, Thomas...
Zeitschrift für Physikalische Chemie. 236 (2021) 6-8 - p. 1013-1053 , 2021

Link: https://doi.org/10.1515/..

8

Dynamic Current–Voltage Analysis of Oxygen Vacancy Mobility..:

Kalaev, Dmitri ; Defferriere, Thomas ; Nicollet, Clement..
Advanced Functional Materials. 30 (2020) 11 - p. , 2020

Link: https://doi.org/10.1002/..

9

Nanostructured Pr-doped Ceria (PCO) thin films as sensing e..:

Ueda, Taro ; Defferriere, Thomas ; Hyodo, Takeo..
Sensors and Actuators B: Chemical. 317 (2020) - p. 128037 , 2020

Link: https://doi.org/10.1016/..

10

Facet-Dependent in Situ Growth of Nanoparticles in Epitaxia..:

Kim, Kun Joong ; Han, Hyeon ; Defferriere, Thomas...
Journal of the American Chemical Society. 141 (2019) 18 - p. 7509-7517 , 2019

Link: https://doi.org/10.1021/..

11

In Situ Method Correlating Raman Vibrational Characteristic..:

Sediva, Eva ; Defferriere, Thomas ; Perry, Nicola H...
Advanced Materials. 31 (2019) 33 - p. , 2019

Link: https://doi.org/10.1002/..

12

Atomic Resolution Imaging of Nanoscale Chemical Expansion i..:

Swallow, Jessica G. ; Lee, Ja Kyung ; Defferriere, Thomas...
ACS Nano. 12 (2018) 2 - p. 1359-1372 , 2018

Link: https://doi.org/10.1021/..

13

Silica: ubiquitous poison of metal oxide interfaces:

Staerz, Anna ; Seo, Han Gil ; Defferriere, Thomas.
10.1039/d1ta08469k. , 2022

Link: https://hdl.handle.net/1..

14

Thin-film chemical expansion of ceria based solid solutions..:

Wulfmeier, Hendrik ; Kohlmann, Dhyan ; Defferriere, Thomas...
http://dx.doi.org/10.1515/zpch-2021-3125. , 2022

Link: https://hdl.handle.net/1..

15

Defects and Ionic Transport at Reduced Temperatures -- Elec..:

Defferriere, Thomas
https://hdl.handle.net/1721.1/150681. , 2022

Link: https://hdl.handle.net/1..