E-LIB Suche - Ergebnisse für: Dekkers, Harold

1

Study of Contact Resistance Components in Short-Channel Ind..:

Tang, Hongwei ; Dekkers, Harold ; Rassoul, Nouredine...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 567-573 , 2024

Link: https://doi.org/10.1109/..

2

Characterization of trap density in Indium-Gallium-Zinc-Oxi..:

Tang, Hongwei ; Belmonte, Attilio ; Lin, Dennis...
Solid-State Electronics. 214 (2024) - p. 108866 , 2024

Link: https://doi.org/10.1016/..

3

Fundamental understanding of NBTI degradation mechanism in ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Zhao, Ying ; Rinaudo, Pietro ; Chasin, Adrian... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

4

Novel Cross-Point Architecture utilizing Distributed Diode ..:

, In: 2024 IEEE International Memory Workshop (IMW),

Ravsher, Taras ; Fantini, Andrea ; Trivedi, Kruti... - p. 1-4 , 2024

Link: https://doi.org/10.1109/..

5

Degradation mechanism of amorphous IGZO-based bipolar metal..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),

Ravsher, Taras ; Fantini, Andrea ; Chasin, Adrian Vaisman... - p. P10-1-P10-5 , 2022

Link: https://doi.org/10.1109/..

6

High-Density Patterning of InGaZnO by CH4: a Comparative St..:

Kundu, Shreya ; Decoster, Stefan ; Bezard, Philippe...
ACS Applied Materials & Interfaces. 14 (2022) 29 - p. 34029-34039 , 2022

Link: https://doi.org/10.1021/..

7

Technology Impact on the Low Frequency Noise of Si and Si/S..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),

Claeys, Cor ; Hellings, Geert ; Arimura, Hiroaki... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

8

Deposition of O atomic layers on Si(100) substrates for epi..:

Jayachandran, Suseendran ; Delabie, Annelies ; Billen, Arne...
Applied Surface Science. 324 (2015) - p. 251-257 , 2015

Link: https://doi.org/10.1016/..

9

Thermal and plasma treatments for improved (sub-)1 nm equiv..:

Veloso, Anabela ; Boccardi, Guillaume ; Ragnarsson, Lars-Åke...
Japanese Journal of Applied Physics. 53 (2014) 4S - p. 04EA04 , 2014

Link: https://doi.org/10.7567/..

10

W versus Co–Al as Gate Fill-Metal for Aggressively Scaled R..:

Veloso, Anabela ; Chew, Soon Aik ; Schram, Tom...
Japanese Journal of Applied Physics. 52 (2013) 4S - p. 04CA03 , 2013

Link: https://doi.org/10.7567/..

11

SiGe Band-to-Band Tunneling Calibration based on p-i-n Diod..:

Kao, Kuo-Hsing ; Verhulst, Anne ; Rooyackers, Rita...
ECS Transactions. 50 (2013) 9 - p. 965-970 , 2013

Link: https://doi.org/10.1149/..

12

Effective Work Function Engineering for Aggressively Scaled..:

Veloso, Anabela ; Chew, Soon Aik ; Higuchi, Yuichi...
Japanese Journal of Applied Physics. 52 (2013) 4S - p. 04CA02 , 2013

Link: https://doi.org/10.7567/..

13

Stress Characterization of Selective Epitaxial Si1-xGex Dep..:

Bargallo Gonzalez, Mireia ; Fernandez-Lanas, Tatiana ; Rosseel, Erik...
ECS Transactions. 25 (2009) 7 - p. 217-227 , 2009

Link: https://doi.org/10.1149/..

14

Large-area epitaxial silicon solar cells based on industria..:

Duerinckx, Filip ; Nieuwenhuysen, Kris Van ; Kim, Hyonju...
Progress in Photovoltaics: Research and Applications. 13 (2005) 8 - p. 673-690 , 2005

Link: https://doi.org/10.1002/..

15

Light-Assisted Investigation of the Role of Oxygen Flow dur..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Rinaudo, Pietro ; Chasin, Adrian ; Zhao, Ying... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..