E-LIB Suche - Ergebnisse für: Delhez, R

1

A diffracted-beam monochromator for long linear detectors i..:

van der Pers, N. M. ; Hendrikx, R. W. A. ; Delhez, R..
Review of Scientific Instruments. 84 (2013) 4 - p. , 2013

Link: https://doi.org/10.1063/..

2

The effect of tensile deformation by in situ ultrasonic tre..:

Dutta, R.K. ; Petrov, R.H. ; Delhez, R....
Acta Materialia. 61 (2013) 5 - p. 1592-1602 , 2013

Link: https://doi.org/10.1016/..

3

A low-temperature study to examine the role of ε-martensite..:

Datta, K. ; Delhez, R. ; Bronsveld, P.M....
Acta Materialia. 57 (2009) 11 - p. 3321-3326 , 2009

Link: https://doi.org/10.1016/..

4

Line broadening analysis using integral breadth methods: a ..:

Scardi, P. ; Leoni, M. ; Delhez, R.
Journal of Applied Crystallography. 37 (2004) 3 - p. 381-390 , 2004

Link: https://doi.org/10.1107/..

5

Analysis of ball-milled Mo powder using X-ray diffraction:

Bor, T. C. ; Huisman, M. C. ; Kamminga, J.-D...
Philosophical Magazine. 83 (2003) 29 - p. 3327-3373 , 2003

Link: https://doi.org/10.1080/..

6

Simulation of X-ray diffraction-line broadening due to disl..:

Bor, T.C ; Cleveringa, H.H.M ; Delhez, R.
Materials Science and Engineering: A. 309-310 (2001) - p. 505-509 , 2001

Link: https://doi.org/10.1016/..

7

Measurement of dislocation distributions by means of X-ray ..:

Kamminga, J.-D ; Delhez, R
Materials Science and Engineering: A. 309-310 (2001) - p. 55-59 , 2001

Link: https://doi.org/10.1016/..

8

A tool for X-ray diffraction analysis of thin layers on sub..:

Kamminga, J.-D. ; Delhez, R. ; de Keijser, Th. H..
Journal of Applied Crystallography. 33 (2000) 1 - p. 108-111 , 2000

Link: https://doi.org/10.1107/..

9

Calculation of diffraction line profiles from specimens wit..:

Kamminga, J.-D. ; Delhez, R.
Journal of Applied Crystallography. 33 (2000) 4 - p. 1122-1127 , 2000

Link: https://doi.org/10.1107/..

10

New methods for diffraction stress measurement: a critical ..:

Kamminga, J.-D. ; de Keijser, Th. H. ; Mittemeijer, E. J..
Journal of Applied Crystallography. 33 (2000) 4 - p. 1059-1066 , 2000

Link: https://doi.org/10.1107/..

11

X-ray diffraction analysis of stacking and twin faults in f..:

Velterop, L. ; Delhez, R. ; de Keijser, Th. H...
Journal of Applied Crystallography. 33 (2000) 2 - p. 296-306 , 2000

Link: https://doi.org/10.1107/..

12

EPDIC 6: proceedings of the Sixth European Powder Diffracti..

Materials science forum, v. 321-324

Delhez, R ; Mittemeijer, E. J , 2000

Link: https://search.ebscohost..

13

On the origin of stress in magnetron sputtered TiN layers:

Kamminga, J.-D. ; de Keijser, Th. H. ; Delhez, R..
Journal of Applied Physics. 88 (2000) 11 - p. 6332-6345 , 2000

Link: https://doi.org/10.1063/..

14

A model for stress in thin layers induced by misfitting par..:

Kamminga, J.-D ; de Keijser, Th.H ; Delhez, R.
Thin Solid Films. 317 (1998) 1-2 - p. 169-172 , 1998

Link: https://doi.org/10.1016/..

15

Simulation of X-ray diffraction-line broadening for a mater..:

Bor, T.C. ; Delhez, R. ; Mittemeijer, E.J..
Materials Science and Engineering: A. 234-236 (1997) - p. 896-899 , 1997

Link: https://doi.org/10.1016/..