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2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) ,
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Evaluating the Reliability of Integer Multipliers With Resp..:
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Lecture Notes in Computer Science; High Performance Computing ,
2
Functional Testing with STLs: A Step Towards Reliable RISC-..:
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2023 IEEE European Test Symposium (ETS) ,
3
Automating the Generation of Functional Stress Inducing Sti..:
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2023 IEEE 32nd Asian Test Symposium (ATS) ,
4
Automatic Identification of Functionally Untestable Cell-Aw..:
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2023 IEEE European Test Symposium (ETS) ,
5
A Survey of Recent Developments in Testability, Safety and ..:
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2023 IEEE European Test Symposium (ETS) ,
6
Constraint-Based Automatic SBST Generation for RISC-V Proce..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
8
Using Formal Methods to Support the Development of STLs for..:
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2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) ,
9
Improving the Fault Resilience of Neural Network Applicatio..:
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2020 IEEE Latin-American Test Symposium (LATS) ,
10
Evaluating the Code Encryption Effects on Memory Fault Resi..:
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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ,
11