Dellby, N.
77  Ergebnisse:
Personensuche X
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1

STEM Developments: A Versatile Light Injector/Collector, Fa..:

Martis, J ; Plotkin-Swing, B ; Haas, B...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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2

Atomic Resolution Secondary Electron Imaging of Top and Bot..:

Plotkin-Swing, B ; Martis, J ; Su, C...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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3

Ultra-High Energy Resolution EELS Beyond Room Temperature:

Johnson, C W ; Hotz, M T ; Krivanek, O L...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
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4

Atomic Resolution SE Imaging in a 30-200 keV Aberration-cor..:

Hotz, M T ; Martis, J ; Radlicka, T...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 2064-2065 , 2023
 
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5

Ultra-high Resolution EELS Analysis and STEM Imaging at 20 ..:

Dellby, N ; Quillin, S C ; Krivanek, O L...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 626-627 , 2023
 
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6

Ultra-high Energy Resolution EELS and 4D STEM at Cryogenic ..:

Plotkin-Swing, B ; Mittelberger, A ; Haas, B...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 1698-1699 , 2023
 
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7

Multi-Sun EELS: Ultra-High Energy Resolution combined with ..:

Dellby, N ; Krivanek, OL ; Bacon, NJ...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 2640-2642 , 2022
 
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8

Aberration-corrected scanning transmission electron microsc..:

Pennycook, S. J. ; Lupini, A. R. ; Kadavanich, A....
International Journal of Materials Research.  94 (2022)  4 - p. 350-357 , 2022
 
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10

Progress in Ultra-High Energy Resolution EELS:

Lovejoy, TC ; Corbin, GJ ; Dellby, N...
Microscopy and Microanalysis.  25 (2019)  S2 - p. 628-629 , 2019
 
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11

Advances in STEM and EELS: New Operation Modes, Detectors a..:

Bleloch, A.L. ; Bacon, N.J. ; Corbin, G.J....
Microscopy and Microanalysis.  25 (2019)  S2 - p. 512-513 , 2019
 
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12

Advances in Ultra-High Energy Resolution STEM-EELS:

Lovejoy, T.C. ; Corbin, G.C. ; Dellby, N...
Microscopy and Microanalysis.  24 (2018)  S1 - p. 446-447 , 2018
 
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13

Ultra-High Energy Resolution EELS:

Lovejoy, T.C. ; Bacon, N.J. ; Bleloch, A.L....
Microscopy and Microanalysis.  23 (2017)  S1 - p. 1552-1553 , 2017
 
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