E-LIB Suche - Ergebnisse für: Deshayes, Y.

1

Life test result on 4 channel VCELs chip used in 28Gb/s dat..:

Joly, S. ; Ouattara, M. ; Guibault, G....
Microelectronics Reliability. 150 (2023) - p. 115120 , 2023

Link: https://doi.org/10.1016/..

2

Practical optical gain by an extended Hakki-Paoli method:

Vanzi, M. ; Marcello, G. ; Mura, G....
Microelectronics Reliability. 76-77 (2017) - p. 579-583 , 2017

Link: https://doi.org/10.1016/..

3

Correlation between forward-reverse low-frequency noise and..:

Del Vecchio, P. ; Curutchet, A. ; Deshayes, Y....
Microelectronics Reliability. 55 (2015) 9-10 - p. 1741-1745 , 2015

Link: https://doi.org/10.1016/..

4

Durability study of a fluorescent optical memory in glass s..:

Royon, A. ; Bourhis, K. ; Béchou, L....
Microelectronics Reliability. 53 (2013) 9-11 - p. 1514-1518 , 2013

Link: https://doi.org/10.1016/..

5

High-power diode laser bars and shear strain:

Cassidy, Daniel T. ; Rehioui, O. ; Hall, Chadwick K....
Optics Letters. 38 (2013) 10 - p. 1633 , 2013

Link: https://doi.org/10.1364/..

6

Effects of silicone coating degradation on GaN MQW LEDs per..:

Baillot, R. ; Deshayes, Y. ; Bechou, L....
Microelectronics Reliability. 50 (2010) 9-11 - p. 1568-1573 , 2010

Link: https://doi.org/10.1016/..

7

Selective activation of failure mechanisms in packaged doub..:

Deshayes, Y. ; Bord, I. ; Barreau, G....
Microelectronics Reliability. 48 (2008) 8-9 - p. 1354-1360 , 2008

Link: https://doi.org/10.1016/..

8

Measurement of the thermal characteristics of packaged doub..:

Bechou, L. ; Rehioui, O. ; Deshayes, Y....
Optics & Laser Technology. 40 (2008) 4 - p. 589-601 , 2008

Link: https://doi.org/10.1016/..

9

Reliability investigations of 850 nm silicon photodiodes un..:

Bourqui, M.L. ; Béchou, L. ; Gilard, O....
Microelectronics Reliability. 48 (2008) 8-9 - p. 1202-1207 , 2008

Link: https://doi.org/10.1016/..

10

Long‐term Reliability Prediction of 935 nm LEDs Using Failu..:

Deshayes, Y. ; Bechou, L. ; Verdier, F..
Quality and Reliability Engineering International. 21 (2005) 6 - p. 571-594 , 2005

Link: https://doi.org/10.1002/..

11

Electroluminescence spectroscopy for reliability investigat..:

Huyghe, S. ; Bechou, L. ; Zerounian, N....
Microelectronics Reliability. 45 (2005) 9-11 - p. 1593-1599 , 2005

Link: https://doi.org/10.1016/..

12

Reliability estimation of BGA and CSP assemblies using degr..:

Delétage, J.-Y. ; Verdier, F.J.-M. ; Plano, B....
Microelectronics Reliability. 43 (2003) 7 - p. 1137-1144 , 2003

Link: https://doi.org/10.1016/..

13

Impact of 1.55 μm laser diode degradation laws on fibre opt..:

Mendizabal, L. ; Verneuil, J.L. ; Bechou, L....
Microelectronics Reliability. 43 (2003) 9-11 - p. 1743-1749 , 2003

Link: https://doi.org/10.1016/..

14

Three-dimensional FEM simulations of thermomechanical stres..:

Deshayes, Y. ; Bechou, L. ; Deletage, J.Y....
Microelectronics Reliability. 43 (2003) 7 - p. 1125-1136 , 2003

Link: https://doi.org/10.1016/..

15

Early failure signatures of 1310 nm laser modules using ele..:

Deshayes, Y ; Bechou, L ; Mendizabal, L.
Measurement. 34 (2003) 2 - p. 157-178 , 2003

Link: https://doi.org/10.1016/..