Devgan, Anirudh
42  Ergebnisse:
Personensuche X
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1

Accelerated design of analog, mixed-signal circuits in Tita:

, In: Proceedings of the 2009 international symposium on Physical design,
 
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2

Reinventing EDA with manycore processors:

, In: Proceedings of the 45th annual Design Automation Conference,
Sapatnekar, Sachin ; Haritan, Eshel ; Keutzer, Kurt... - p. 126-127 , 2008
 
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3

Session details: Analog and RF simulation:

, In: Proceedings of the 44th annual Design Automation Conference,
 
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4

Robust analytical gate delay modeling for low voltage circu..:

, In: Proceedings of the 2006 Asia and South Pacific Design Automation Conference,
 
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5

Variability modeling and variability-aware design in deep s..:

, In: Proceedings of the 15th ACM Great Lakes symposium on VLSI,
 
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6

Sleep transistor sizing using timing criticality and tempor..:

, In: Proceedings of the 2005 Asia and South Pacific Design Automation Conference,
Ramalingam, Anand ; Zhang, Bin ; Devgan, Anirudh. - p. 1094-1097 , 2005
 
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7

Achieving continuous VT performance in a dual VT process:

, In: Proceedings of the 2005 Asia and South Pacific Design Automation Conference,
 
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8

Leakage power : trends, analysis and avoidance:

, In: Proceedings of the 2005 Asia and South Pacific Design Automation Conference,
Blaauw, David ; Devgan, Anirudh ; Najm, Farid - p. 1 ff. , 2005
 
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9

Spatially distributed 3D circuit models:

, In: Proceedings of the 42nd annual Design Automation Conference,
Beattie, Michael ; Zheng, Hui ; Devgan, Anirudh. - p. 153-158 , 2005
 
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10

Power grid voltage integrity verification:

, In: Proceedings of the 2005 international symposium on Low power electronics and design,
Nizam, Maha ; Najm, Farid N. ; Devgan, Anirudh - p. 239-244 , 2005
 
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11

An efficient algorithm for statistical minimization of tota..:

, In: Proceedings of the 42nd annual Design Automation Conference,
 
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12

Session details: Statistical timing analysis:

, In: Proceedings of the 41st annual Design Automation Conference,
 
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13

Session details: Noise-tolerant design and analysis techniq..:

, In: Proceedings of the 41st annual Design Automation Conference,
 
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14

Parametric yield estimation considering leakage variability:

, In: Proceedings of the 41st annual Design Automation Conference,
Rao, Rajeev R. ; Devgan, Anirudh ; Blaauw, David. - p. 442-447 , 2004
 
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15

Delay and slew metrics using the lognormal distribution:

, In: Proceedings of the 40th annual Design Automation Conference,
 
1-15