Ich stimme zu, dass diese Seite Cookies verwende. Weitere Informationen finden Sie unter unseren Datenschutzerklärungen .
X
Devriendt, K.
574  Ergebnisse:
Personensuche X
?
1

Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Veloso, A. ; Jourdain, A. ; Radisic, D.... - p. 284-285 , 2022
Link: https://doi.org/10.1109/..
 
?
2

Buried Power Rail Metal exploration towards the 1 nm Node:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Gupta, A. ; Radisic, D. ; Maes, J. W.... - p. 22.5.1-22.5.4 , 2021
Link: https://doi.org/10.1109/..
 
?
3

Buried Power Rail Integration with Si FinFETs for CMOS Scal..:

, In: 2020 IEEE Symposium on VLSI Technology,
Gupta, A. ; Mertens, H. ; Tao, Z.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
?
4

Scaled transistors with 2D materials from the 300mm fab:

, In: 2020 IEEE Silicon Nanoelectronics Workshop (SNW),
Asselberghs, I. ; Schram, T. ; Smets, Q.... - p. 67-68 , 2020
Link: https://doi.org/10.1109/..
 
?
5

First Monolithic Integration of 3D Complementary FET (CFET)..:

, In: 2020 IEEE Symposium on VLSI Technology,
Subramanian, S. ; Hosseini, M. ; Chiarella, T.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
?
6

Buried Power Rail Scaling and Metal Assessment for the 3 nm..:

, In: 2020 IEEE International Electron Devices Meeting (IEDM),
Gupta, A. ; Pedreira, O. Varela ; Tao, Z.... - p. 20.3.1-20.3.4 , 2020
Link: https://doi.org/10.1109/..
 
?
7

3D sequential low temperature top tier devices using dopant..:

, In: 2020 IEEE Symposium on VLSI Technology,
Vandooren, A. ; Wu, Z. ; Parihar, N.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
?
8

Vertical Nanowire and Nanosheet FETs: Device Features, Nove..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Veloso, A. ; Hikavyy, A. ; Loo, R.... - p. 11.1.1-11.1.4 , 2019
Link: https://doi.org/10.1109/..
 
?
9

Anthropometric and aesthetic outcomes for the nasolabial re..:

Mbuyi-Musanzayi, S. ; Tshilombo Katombe, F. ; Lukusa Tshilobo, P....
International Journal of Oral and Maxillofacial Surgery.  46 (2017)  10 - p. 1338-1345 , 2017
Link: https://doi.org/10.1016/..
 
?
10

Facial dysmorphism is influenced by ethnic background of th..:

Lumaka, A. ; Cosemans, N. ; Lulebo Mampasi, A....
Clinical Genetics.  92 (2017)  2 - p. 166-171 , 2017
Link: https://doi.org/10.1111/..
 
?
11

Pseudoinverse of the Laplacian and best spreader node in a ..:

Van Mieghem, P. ; Devriendt, K. ; Cetinay, H.
Physical Review E.  96 (2017)  3 - p. , 2017
Link: https://doi.org/10.1103/..
 
?
12

In Depth Analysis of 3D NAND Enablers in Gate Stack Integra..:

, In: 2017 IEEE International Memory Workshop (IMW),
Tan, C.-L. ; Lavizzari, S. ; Blomme, P.... - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
?
13

Unified mean-field framework for susceptible-infected-susce..:

Devriendt, K. ; Van Mieghem, P.
Physical Review E.  96 (2017)  5 - p. , 2017
Link: https://doi.org/10.1103/..
 
?
14

A Comprehensive Craniofacial Study of 22q11.2 Deletion Synd..:

Lewyllie, A. ; Roosenboom, J. ; Indencleef, K....
Journal of Dental Research.  96 (2017)  12 - p. 1386-1391 , 2017
Link: https://doi.org/10.1177/..
 
?
15

NovelIRF6Mutations Detected in Orofacial Cleft Patients by ..:

Khandelwal, K.D. ; Ishorst, N. ; Zhou, H....
Journal of Dental Research.  96 (2016)  2 - p. 179-185 , 2016
Link: https://doi.org/10.1177/..
 
1-15