Diouf, C.
473  Ergebnisse:
Personensuche X
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1

Non-conducting Hot carrier temperature activation and tempe..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Federspiel, X. ; Diouf, C. ; Arunachalam, B... - p. 1-6 , 2024
 
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2

40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fM..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Cremer, S. ; Pelloux, N. ; Gianesello, F.... - p. 101-104 , 2023
 
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3

Insight Into HCI Reliability on I/O Nitrided Devices:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Doyen, C. ; Yon, V. ; Garros, X.... - p. 1-5 , 2023
 
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4

Modulation Of HCI in I/O analog devices Through Process Spe..:

, In: 2023 IEEE International Integrated Reliability Workshop (IIRW),
Diouf, C. ; Federspiel, X. ; Bravaix, A.... - p. 1-8 , 2023
 
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5

0.13 μm HR SiGe BiCMOS Technology exhibiting 169 fs Ron x C..:

, In: 2022 International Electron Devices Meeting (IEDM),
Gianesello, F. ; Charbuillet, C. ; Derrier, N.... - p. 11.7.1-11.7.4 , 2022
 
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6

Profil des arthrites réactionnelles à Dakar (Sénégal) : à p..:

Condé, K ; Garba, MS ; Niasse, M...
Rhumatologie Africaine Francophone.  2 (2022)  2 - p. 1-5 , 2022
 
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7

Formes familiales de polyarthrite rhumatoïde : étude de 17 ..:

Diallo, S ; Diallo, R ; Niasse, M...
Rhumatologie Africaine Francophone.  1 (2021)  2 - p. 28-35 , 2021
 
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8

HCI Temperature sense effect from 180nm to 28nm nodes:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Federspiel, X. ; Camara, A. ; Michard, A... - p. 1-5 , 2021
 
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9

Comparison of variability of HCI induced drift for SiON and..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Federspiel, X. ; Diouf, C. ; Cacho, F.. - p. 1-5 , 2020
 
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10

Robustness analysis of a parallel two-box digital polynomia..:

Diouf, C. ; Younes, M. ; Noaja, A....
Optics Communications.  402 (2017)  - p. 442-452 , 2017
 
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