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Dixit, Ankit
137  Ergebnisse:
Personensuche X
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1

Biomolecule detection using GaAs1−xSbX FET based dielectric..:

Dixit, Ankit ; Samajdar, Dip Prakash ; Shukla, Rajendra P..
Physica Scripta.  99 (2024)  2 - p. 025020 , 2024
Link: https://doi.org/10.1088/..
 
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2

Sensitivity and Reliability Assessment of a Strained Silico..:

, In: 2024 IEEE Latin American Electron Devices Conference (LAEDC),
Gandhi, Navneet ; Rathore, Sunil ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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3

Steep-Subthreshold Bilayer Tunnel Field-Effect Transistor-B..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  8 (2024)  8 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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4

Ultra Thin Finger-Like Source Region-Based TFET: Temperatur..:

Singh, Prabhat ; Raman, Ashish ; Yadav, Dharmendra Singh...
IEEE Sensors Letters.  8 (2024)  5 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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5

Low-Voltage Feedback-Field-Effect-Transistor-Based Ion Sens..:

Kumar, Prateek ; Kumar, Naveen ; Dixit, Ankit...
IEEE Sensors Letters.  8 (2024)  6 - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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6

Electrolyte-Gated FET-based Sensing of Immobilized Amphoter..:

, In: 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Kumar, Naveen ; Garcia, Cesar Pascual ; Rezaei, Ali... - p. 377-380 , 2023
Link: https://doi.org/10.23919..
 
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7

Microstructural characteristics and tensile properties of E..:

Shukla, Vishakha ; Kumar, Vikash ; Dixit, Ankit
Materials Today: Proceedings.  , 2023
Link: https://doi.org/10.1016/..
 
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8

Insights into the Ultra-Steep Subthreshold Slope Gate-all-a..:

, In: 2023 IEEE Nanotechnology Materials and Devices Conference (NMDC),
Kumar, Naveen ; Dixit, Ankit ; Rezaei, Ali... - p. 617-620 , 2023
Link: https://doi.org/10.1109/..
 
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9

Novel Detection Methodology of Milk-Oligopeptides Fingerpri..:

, In: 2023 IEEE BioSensors Conference (BioSensors),
Kumar, Naveen ; Garcia, Cesar Pascual ; Dixit, Ankit.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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10

Gate Oxide Induced Reliability Assessment of Junctionless F..:

, In: 2023 IEEE SENSORS,
Gandhi, Navneet ; Jaisawal, Rajeewa Kumar ; Rathore, Sunil... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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11

Charge dynamics of amino acids fingerprints and the effect ..:

Kumar, Naveen ; García, César Pascual ; Dixit, Ankit..
Solid-State Electronics.  210 (2023)  - p. 108789 , 2023
Link: https://doi.org/10.1016/..
 
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12

Intuitionistic fuzzy time series forecasting method for non..:

Dixit, Ankit ; Jain, Shikha
Information Sciences.  623 (2023)  - p. 132-145 , 2023
Link: https://doi.org/10.1016/..
 
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13

Analytical Model of Dual Cavity Nanowire Tunnel FET-based D..:

, In: 2023 IEEE Devices for Integrated Circuit (DevIC),
Sarkhel, Saheli ; Rathore, Sunil ; Saha, Priyanka... - p. 470-475 , 2023
Link: https://doi.org/10.1109/..
 
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14

Device Design Aware and Interface Thermal Resistance Assist..:

, In: 2022 IEEE International Conference on Emerging Electronics (ICEE),
Rathore, Sunil ; Banchhor, Shashank Kumar ; Jaisawal, Rajeewa Kumar... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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15

Design Principles of 22-nm SOI LDD-FinFETs for Ultra-Low-Po..:

Dixit, Ankit ; Kori, Pavan Kumar ; Rajan, Chithraja.
Journal of Electronic Materials.  51 (2022)  3 - p. 1029-1040 , 2022
Link: https://doi.org/10.1007/..
 
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