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Doyen, Célestin
8  Ergebnisse:
Personensuche X
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1

Investigating Reliability of NIR QD-based Photodiodes Under..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Hammad, Ismail ; Coignus, Jean ; Ney, David... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
Sensors.  20 (2020)  1 - p. 287 , 2020
Link: https://doi.org/10.3390/..
 
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3

Caractérisations électriques innovantes de capteurs d'image..:

Doyen, Célestin
http://www.theses.fr/2021ESAE0022/document.  , 2021
Link: http://www.theses.fr/202..
 
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4

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20010287.  , 2020
Link: https://hal.archives-ouv..
 
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5

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982946/.  , 2020
Link: http://www.ncbi.nlm.nih...
 
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6

Electrical Characterization of the Backside Interface on BS..:

Doyen, Célestin ; Ricq, Stéphane ; Magnan, Pierre...
https://oatao.univ-toulouse.fr/26913/1/Doyen_26913.pdf.  , 2020
Link: https://oatao.univ-toulo..
 
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7

Electrical Characterization of the Backside Interface on BS..:

Célestin Doyen ; Stéphane Ricq ; Pierre Magnan...
https://www.mdpi.com/1424-8220/20/1/287.  , 2020
Link: https://doi.org/10.3390/..
 
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8

Electrical Characterization of the Backside Interface on BS..:

Célestin Doyen ; Stéphane Ricq ; Pierre Magnan...
https://dx.doi.org/10.3390/s20010287.  , 2020
Link: https://doi.org/10.3390/..
 
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