E-LIB Suche - Ergebnisse für: Driussi, Francesco

1

Analysis and Compensation of the Series Resistance Effects ..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),

Massarotto, Marco ; Driussi, Francesco ; Bucovaz, Mattia... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

2

Compact expression to model the effects of dielectric absor..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),

Saro, Simone ; Palestri, Pierpaolo ; Caruso, Enrico... - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

3

Reinterpreting Low Resistance in Sb–MoS2 Ohmic Contacts by ..:

Lizzit, Daniel ; Pala, Marco ; Driussi, Francesco.
IEEE Transactions on Electron Devices. 71 (2024) 5 - p. 3301-3306 , 2024

Link: https://doi.org/10.1109/..

4

Reducing the tunneling barrier thickness of bilayer ferroel..:

, In: 2023 Device Research Conference (DRC),

Lancaster, Suzanne ; Segatto, Mattia ; Silva, Claudia... - p. 1-2 , 2023

Link: https://doi.org/10.1109/..

5

Novel experimental methodologies to reconcile large- and sm..:

Massarotto, Marco ; Driussi, Francesco ; Affanni, Antonio...
Solid-State Electronics. 200 (2023) - p. 108569 , 2023

Link: https://doi.org/10.1016/..

6

Editorial: Selected papers from the 8th Joint International..:

Driussi, Francesco ; Esseni, David ; Lizzit, Daniel.
Solid-State Electronics. 201 (2023) - p. 108603 , 2023

Link: https://doi.org/10.1016/..

7

Ohmic Behavior in Metal Contacts to n/p-Type Transition-Met..:

Lizzit, Daniel ; Khakbaz, Pedram ; Driussi, Francesco..
ACS Applied Nano Materials. 6 (2023) 7 - p. 5737-5746 , 2023

Link: https://doi.org/10.1021/..

8

Experimental Characterization of Separate Absorption–Multip..:

Colja, Matija ; Cautero, Marco ; Arfelli, Fulvia...
Photonics. 10 (2023) 8 - p. 933 , 2023

Link: https://doi.org/10.3390/..

9

Limitations to Electrical Probing of Spontaneous Polarizati..:

Segatto, Mattia ; Fontanini, Riccardo ; Driussi, Francesco..
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 324-333 , 2022

Link: https://doi.org/10.1109/..

10

Synchrotron Radiation Study of Gain, Noise, and Collection ..:

Colja, Matija ; Cautero, Marco ; Menk, Ralf Hendrik...
Sensors. 22 (2022) 12 - p. 4598 , 2022

Link: https://doi.org/10.3390/..

11

A study of metal-MoS2 contacts by using an in-house develop..:

Lizzit, Daniel ; Khakbaz, Pedram ; Driussi, Francesco..
Solid-State Electronics. 194 (2022) - p. 108365 , 2022

Link: https://doi.org/10.1016/..

12

Editorial: Letters from the 8th Joint International EUROSOI..:

Driussi, Francesco ; Esseni, David ; Lizzit, Daniel.
Solid-State Electronics. 194 (2022) - p. 108354 , 2022

Link: https://doi.org/10.1016/..

13

Modeling and Design of FTJs as Multi-Level Low Energy Memri..:

Fontanini, Riccardo ; Segatto, Mattia ; Massarotto, Marco...
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 1202-1209 , 2021

Link: https://doi.org/10.1109/..

14

Dependable Contact Related Parameter Extraction in Graphene..:

Gahoi, Amit ; Kataria, Satender ; Driussi, Francesco...
Advanced Electronic Materials. 6 (2020) 10 - p. , 2020

Link: https://doi.org/10.1002/..

15

Reliability analysis of the metal-graphene contact resistan..:

, In: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS),

Venica, Stefano ; Driussi, Francesco ; Gahoi, Amit... - p. 57-62 , 2018

Link: https://doi.org/10.1109/..