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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
1
Analysis and Compensation of the Series Resistance Effects ..:
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2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) ,
2
Compact expression to model the effects of dielectric absor..:
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2023 Device Research Conference (DRC) ,
4
Reducing the tunneling barrier thickness of bilayer ferroel..:
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2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) ,
15