Drummond, I.W.
1839  Ergebnisse:
Personensuche X
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1

Transient Phenomena and Impurity Relocation in SIMS Depth P..:

Wittmaack, K. ; Drummond, I. W.
Philosophical Transactions: Mathematical, Physical and Engineering Sciences.  354 (1996)  1719 - p. 2731-2764 , 1996
 
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2

Spatial Resolution in X-Ray Photoelectron Spectroscopy [and..:

Drummond, I. W. ; Bryson, R. M. D.
Philosophical Transactions: Mathematical, Physical and Engineering Sciences.  354 (1996)  1719 - p. 2667-2682 , 1996
 
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3

Practical polymer film characterisation using high performa..:

Drummond, I. W. ; Robinson, K. S. ; Carrick, A..
Fresenius' Journal of Analytical Chemistry.  346 (1993)  1-3 - p. 200-204 , 1993
 
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6

Aspects of multidetector use in multitechnique surface anal..:

Drummond, I.W. ; Cooper, T.A. ; Street, F.J.
Spectrochimica Acta Part B: Atomic Spectroscopy.  40 (1985)  5-6 - p. 773-779 , 1985
 
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7

Four classes of selected area XPS (SAXPS): an examination o..:

Drummond, I.W. ; Cooper, T.A. ; Street, F.J.
Spectrochimica Acta Part B: Atomic Spectroscopy.  40 (1985)  5-6 - p. 801-810 , 1985
 
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10

Auger electron spectroscopy (AES) an appraisal:

Alford, N. A. ; Barrie, A. ; Drummond, I. W..
Surface and Interface Analysis.  1 (1979)  1 - p. 36-44 , 1979
 
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11

Examination of contamination on electrical insulators by XP:

Drummond, I. W.
Surface and Interface Analysis.  1 (1979)  2 - p. 71-72 , 1979
 
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12

Correlation of calculated and measured 2p spin-orbit splitt..:

Barrie, A. ; Drummond, I.W. ; Herd, Q.C.
Journal of Electron Spectroscopy and Related Phenomena.  5 (1974)  1 - p. 217-225 , 1974
 
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15

Toward standard reference values for the thermal conductivi..:

Assael, M. J. ; Dix, M. ; Drummond, I....
International Journal of Thermophysics.  18 (1997)  2 - p. 439-446 , 1997
 
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