Duewer, Fred
17  Ergebnisse:
Personensuche X
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3

3-D X-ray Microscopy using a Laboratory Source:

Feser, Michael ; Duewer, Fred ; Wang, Steve...
Microscopy and Microanalysis.  10 (2004)  S02 - p. 1036-1037 , 2004
 
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6

Tip–sample distance feedback control in a scanning evanesce..:

Duewer, Fred ; Gao, C. ; Xiang, X.-D.
Review of Scientific Instruments.  71 (2000)  6 - p. 2414-2417 , 2000
 
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10

Quantitative microwave evanescent microscopy:

Gao, Chen ; Duewer, Fred ; Xiang, X.-D.
Applied Physics Letters.  75 (1999)  19 - p. 3005-3007 , 1999
 
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11

Quantitative nonlinear dielectric microscopy of periodicall..:

Gao, Chen ; Duewer, Fred ; Lu, Yalin.
Applied Physics Letters.  73 (1998)  8 - p. 1146-1148 , 1998
 
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14

Low temperature scanning-tip microwave near-field microscop..:

Takeuchi, I. ; Wei, T. ; Duewer, Fred...
Applied Physics Letters.  71 (1997)  14 - p. 2026-2028 , 1997
 
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15

High spatial resolution quantitative microwave impedance mi..:

Gao, Chen ; Wei, Tao ; Duewer, Fred..
Applied Physics Letters.  71 (1997)  13 - p. 1872-1874 , 1997
 
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