E-LIB Suche - Ergebnisse für: Duzellier, S.

1

Injection-Free and Cavity Free Parametric Sources for Futur..:

, In: Space-based Lidar Remote Sensing Techniques and Emerging Technologies; Springer Aerospace Technology,

Dherbecourt, Jean-Baptiste ; Mølster, Kjell Martin ; Zheng, Antoine... - p. 363-371 , 2024

2

Interaction mechanisms between Atomic Oxygen and materials:..:

Leveque, D ; Duzellier, S ; Vilaranda Fernandes, M...
IOP Conference Series: Materials Science and Engineering. 1287 (2023) 1 - p. 012010 , 2023

Link: https://doi.org/10.1088/..

3

Influence of LDD spacers on total ionizing dose response of..:

Cussac, G. ; Nuns, T. ; Ducret, S...
Microelectronics Reliability. 135 (2022) - p. 114603 , 2022

Link: https://doi.org/10.1016/..

4

Space debris generation in GEO: Space materials testing and..:

Duzellier, S. ; Gordo, P. ; Melicio, R....
Acta Astronautica. 192 (2022) - p. 258-275 , 2022

Link: https://doi.org/10.1016/..

5

Impact of 1 MeV proton irradiation on InGaAsN solar cells:

Levillayer, M ; Duzellier, S ; Massiot, I...
Semiconductor Science and Technology. 37 (2022) 5 - p. 05LT02 , 2022

Link: https://doi.org/10.1088/..

6

System for space materials evaluation in LEO environment:

Gordo, P. ; Frederico, T. ; Melicio, R...
Advances in Space Research. 66 (2020) 2 - p. 307-320 , 2020

Link: https://doi.org/10.1016/..

7

Gamma irradiation-induced absorption in single-domain and p..:

Coetzee, R. S. ; Duzellier, S. ; Dherbecourt, J. B....
Optical Materials Express. 7 (2017) 11 - p. 4138 , 2017

Link: https://doi.org/10.1364/..

8

Spectrometers Results of Material Exposure and Degradation ..:

Rejsek-Riba, V. ; Inguimbert, V. ; Duzellier, S....
Journal of Spacecraft and Rockets. 48 (2011) 1 - p. 38-44 , 2011

Link: https://doi.org/10.2514/..

9

Multi-scale modeling to investigate the single event effect..:

Hubert, G. ; Bourdarie, S. ; Artola, L...
Acta Astronautica. 69 (2011) 7-8 - p. 526-536 , 2011

Link: https://doi.org/10.1016/..

10

Electrical aging behavioral modeling for reliability analys..:

Bestory, C. ; Marc, F. ; Duzellier, S..
Microelectronics Reliability. 49 (2009) 9-11 - p. 946-951 , 2009

Link: https://doi.org/10.1016/..

11

Application of laser testing in study of SEE mechanisms in ..:

Duzellier, S. ; Falguere, D. ; Guibert, L....
IEEE Transactions on Nuclear Science. 47 (2000) 6 - p. 2392-2399 , 2000

Link: https://doi.org/10.1109/..

12

Développement de sous-cellules pin InGaAsN à 1 eV pour inté..:

Levillayer, Maxime ; Almuneau, Guilhem ; Massiot, Inès...
hal-02382557. , 2019

Link: https://hal.science/hal-..

13

Développement de sous-cellules pin InGaAsN à 1 eV pour inté..:

Levillayer, Maxime ; Almuneau, Guilhem ; Massiot, Inès...
hal-02382557. , 2019

Link: https://hal.science/hal-..

14

Développement de sous-cellules pin InGaAsN à 1 eV pour inté..:

Levillayer, Maxime ; Almuneau, Guilhem ; Massiot, Inès...
hal-02382557. , 2019

Link: https://hal.science/hal-..

15

Développement de sous-cellules pin InGaAsN à 1 eV pour inté..:

Levillayer, Maxime ; Almuneau, Guilhem ; Massiot, Inès...
hal-02382557. , 2019

Link: https://hal.science/hal-..