Eccleston, W.
271  Ergebnisse:
Personensuche X
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1

Physica status solidi 

Volume 12, Number 1: July 16  Physica status solidi ; Volume 12, Number 1, A
Aggarwal, M. D ; Albers, C ; Andronikos, P... - Reprint 2021 . , [2022]
 
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2

Physica status solidi 

Volume 12, Number 1: July 16  Physica status solidi ; Volume 12, Number 1, A
Aggarwal, M.D ; Albers, C ; Andronikos, P... - Reprint 2021 . , [2021]
 
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Experimental observation of the density of localized trappi..:

Sedghi, N. ; Donaghy, D. ; Raja, M....
Journal of Non-Crystalline Solids.  352 (2006)  9-20 - p. 1641-1643 , 2006
 
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6

Carbon as an electronics material:

Eccleston, W.
Journal of Materials Science: Materials in Electronics.  17 (2006)  6 - p. 399-404 , 2006
 
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8

Semiconductor, Thick and Thin-Film Microcircuits:

, In: Electrical Engineer's Reference Book,
Eccleston, W ; Grieve, D - p. 6-1-6-9 , 2003
 
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9

Conduction processes in conjugated, highly regio-regular, h..:

Raja, M. ; Lloyd, G. C. R. ; Sedghi, N....
Journal of Applied Physics.  92 (2002)  3 - p. 1441-1445 , 2002
 
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10

Carrier generation and current flow at the interface betwee..:

Eccleston, W.
Microelectronic Engineering.  59 (2001)  1-4 - p. 295-300 , 2001
 
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12

The effect of polysilicon grain boundaries on MOS based dev..:

Eccleston, W.
Microelectronic Engineering.  48 (1999)  1-4 - p. 105-108 , 1999
 
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13

Electrical properties of polymer/Si heterojunctions:

Musa, I. ; Eccleston, W.
Thin Solid Films.  343-344 (1999)  - p. 469-475 , 1999
 
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15

Electronic and Structural Properties of Partially Crystalli..:

Smith, J. P. ; Eccleston, W. ; Brown, P. D..
Journal of The Electrochemical Society.  146 (1999)  1 - p. 306-312 , 1999
 
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