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Edge, Lisa F.
285  Ergebnisse:
Personensuche X
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1

Coherent spin–valley oscillations in silicon:

Cai, Xinxin ; Connors, Elliot J. ; Edge, Lisa F..
Nature Physics.  19 (2023)  3 - p. 386-393 , 2023
Link: https://doi.org/10.1038/..
 
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2

Charge-noise spectroscopy of Si/SiGe quantum dots via dynam..:

Connors, Elliot J. ; Nelson, J. ; Edge, Lisa F..
Nature Communications.  13 (2022)  1 - p. , 2022
Link: https://doi.org/10.1038/..
 
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3

Direct Measurement of Electron Intervalley Relaxation in a ..:

Penthorn, Nicholas E. ; Schoenfield, Joshua S. ; Edge, Lisa F..
Physical Review Applied.  14 (2020)  5 - p. , 2020
Link: https://doi.org/10.1103/..
 
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4

Two-axis quantum control of a fast valley qubit in silicon:

Penthorn, Nicholas E. ; Schoenfield, Joshua S. ; Rooney, John D...
npj Quantum Information.  5 (2019)  1 - p. , 2019
Link: https://doi.org/10.1038/..
 
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5

Atom Probe Tomography: Accurate Quantification of Si/SiGe I..:

Dyck, Ondrej ; Leonard, Donovan N. ; Edge, Lisa F....
Advanced Materials Interfaces.  4 (2017)  21 - p. , 2017
Link: https://doi.org/10.1002/..
 
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6

Accurate Quantification of Si/SiGe Interface Profiles via A..:

Dyck, Ondrej ; Leonard, Donovan N. ; Edge, Lisa F....
Advanced Materials Interfaces.  4 (2017)  21 - p. , 2017
Link: https://doi.org/10.1002/..
 
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7

Metamorphic materials for quantum computing:

Deelman, Peter W. ; Edge, Lisa F. ; Jackson, Clayton A.
MRS Bulletin.  41 (2016)  3 - p. 224-230 , 2016
Link: https://doi.org/10.1557/..
 
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8

Considerations and Challenges with Characterizing Si/SiGe I..:

Dyck, Ondrej ; Leonard, Donovan ; Poplawsky, Jonathan...
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1450-1451 , 2016
Link: https://doi.org/10.1017/..
 
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9

Quantification of Atomic Arrangements at Heterostructure In..:

Leonard, Donovan N. ; Dyck, Ondrej ; Poplawsky, Jonathan D....
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1502-1503 , 2016
Link: https://doi.org/10.1017/..
 
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10

Electron Mobility Limited by Remote Charge Scattering in Th..:

Iijima, Ryosuke ; Edge, Lisa F. ; Paruchuri, Vamsi.
Japanese Journal of Applied Physics.  51 (2012)  4R - p. 044102 , 2012
Link: https://doi.org/10.7567/..
 
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11

Electron Mobility Limited by Remote Charge Scattering in Th..:

Iijima, Ryosuke ; Edge, Lisa F. ; Paruchuri, Vamsi.
Japanese Journal of Applied Physics.  51 (2012)  4R - p. 044102 , 2012
Link: https://doi.org/10.1143/..
 
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12

Characteristics of La2O3- and Al2O3-Capped HfO2 Dielectric ..:

Iijima, Ryosuke ; Edge, Lisa F. ; Bruley, John..
Japanese Journal of Applied Physics.  50 (2011)  5R - p. 050201 , 2011
Link: https://doi.org/10.1143/..
 
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13

Intrinsic Effects of the Crystal Orientation Difference bet..:

Iijima, Ryosuke ; Edge, Lisa F. ; Bruley, John..
Japanese Journal of Applied Physics.  50 (2011)  6R - p. 061503 , 2011
Link: https://doi.org/10.7567/..
 
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14

Characteristics of La2O3- and Al2O3-Capped HfO2Dielectric M..:

Iijima, Ryosuke ; Edge, Lisa F. ; Bruley, John..
Japanese Journal of Applied Physics.  50 (2011)  5R - p. 050201 , 2011
Link: https://doi.org/10.7567/..
 
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15

Intrinsic Effects of the Crystal Orientation Difference bet..:

Iijima, Ryosuke ; Edge, Lisa F. ; Bruley, John..
Japanese Journal of Applied Physics.  50 (2011)  6R - p. 061503 , 2011
Link: https://doi.org/10.1143/..
 
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