Elings, V.
60  Ergebnisse:
Personensuche X
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2

Analysis of the interaction mechanisms in dynamic mode SFM ..:

Anczykowski, B. ; Cleveland, J.P. ; Krüger, D...
Applied Physics A: Materials Science & Processing.  66 (1998)  7 - p. S885-S889 , 1998
 
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3

Scanning probe optical microscopy of evanescent fields:

Taylor, R. S. ; Leopold, K. E. ; Wendman, M...
Review of Scientific Instruments.  69 (1998)  8 - p. 2981-2987 , 1998
 
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7

Short cantilevers for atomic force microscopy:

Walters, D. A. ; Cleveland, J. P. ; Thomson, N. H....
Review of Scientific Instruments.  67 (1996)  10 - p. 3583-3590 , 1996
 
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8

Submicron characterization of recording media using magneti..:

Babcock, K. ; Manalis, S. ; Elings, V...
Journal of Applied Physics.  79 (1996)  8 - p. 6440-6440 , 1996
 
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9

Tapping mode atomic force microscopy in liquids:

Hansma, P. K. ; Cleveland, J. P. ; Radmacher, M....
Applied Physics Letters.  64 (1994)  13 - p. 1738-1740 , 1994
 
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10

A new, optical-lever based atomic force microscope:

Hansma, P. K. ; Drake, B. ; Grigg, D....
Journal of Applied Physics.  76 (1994)  2 - p. 796-799 , 1994
 
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11

Noncontact force microscopy in liquids:

Giles, R. ; Cleveland, J. P. ; Manne, S....
Applied Physics Letters.  63 (1993)  5 - p. 617-618 , 1993
 
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14

The structure and morphology of the skin of polyethersulfon..:

Fritzsche, A. K. ; Arevalo, A. R. ; Connolly, A. F....
Journal of Applied Polymer Science.  45 (1992)  11 - p. 1945-1956 , 1992
 
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