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Entrena, Luis
139  Ergebnisse:
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1

Hardening Architectures for Multiprocessor System-on-Chip:

Aviles, Pablo M. ; García-Astudillo, Luis A. ; Entrena, Luis...
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Analysing the influence of memory and workload on the relia..:

Leon, German ; Badia, Jose M. ; Belloch, Jose A....
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Hybrid Hardening Approach for a Fault-Tolerant RISC-V Syste..:

Santos, Douglas A. ; Aviles, Pablo M. ; Mattos, André M. P....
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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4

Comparative analysis of soft-error sensitivity in LU decomp..:

Leon, German ; Badia, Jose M. ; Belloch, Jose A...
The Journal of Supercomputing.  80 (2024)  9 - p. 12844-12862 , 2024
Link: https://doi.org/10.1007/..
 
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5

Error Mitigation Using Optimized Redundancy for Composite A..:

Garcia-Astudillo, Luis A. ; Lindoso, Almudena ; Entrena, Luis
IEEE Transactions on Aerospace and Electronic Systems.  60 (2024)  2 - p. 2143-2152 , 2024
Link: https://doi.org/10.1109/..
 
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6

Supervised Triple Macrosynchronized Lockstep (STMLS) Archit..:

Aviles, Pablo M. ; Belloch, Jose A. ; Entrena, Luis.
IEEE Access.  11 (2023)  - p. 128706-128723 , 2023
Link: https://doi.org/10.1109/..
 
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7

Formal Verification of Fault-Tolerant Hardware Designs:

Entrena, Luis ; Sánchez-Clemente, Antonio J. ; García-Astudillo, Luis A....
IEEE Access.  11 (2023)  - p. 116127-116140 , 2023
Link: https://doi.org/10.1109/..
 
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8

Evaluating Reduced Resolution Redundancy for Radiation Hard..:

García-Astudillo, Luis A. ; Lindoso, Almudena ; Entrena, Luis...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 2060-2067 , 2023
Link: https://doi.org/10.1109/..
 
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9

High complexity reliable space applications in commercial m..:

Aviles, Pablo M. ; Schäfer, Laura ; Lindoso, Almudena..
Microelectronics Reliability.  138 (2022)  - p. 114679 , 2022
Link: https://doi.org/10.1016/..
 
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10

Impact of Atmospheric and Space Radiation on Sensitive Elec..:

, In: 2022 IEEE European Test Symposium (ETS),
Luza, Lucas Matana ; Wrobel, Frederic ; Entrena, Luis. - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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11

Comparison of Parallel Implementation Strategies in GPU-Acc..:

Badia, Jose M. ; Leon, German ; Belloch, Jose A....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 444-452 , 2022
Link: https://doi.org/10.1109/..
 
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12

Reduced Resolution Redundancy: A Novel Approximate Error Mi..:

Garcia-Astudillo, Luis A. ; Entrena, Luis ; Lindoso, Almudena.
IEEE Access.  10 (2022)  - p. 20643-20651 , 2022
Link: https://doi.org/10.1109/..
 
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13

Analyzing Scaled Reduced Precision Redundancy for Error Mit..:

Garcia-Astudillo, Luis A. ; Lindoso, Almudena ; Entrena, Luis A....
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1485-1491 , 2022
Link: https://doi.org/10.1109/..
 
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14

Radiation Testing of a Multiprocessor Macrosynchronized Loc..:

Aviles, Pablo M. ; Lindoso, Almudena ; Belloch, Jose A....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 462-469 , 2022
Link: https://doi.org/10.1109/..
 
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15

Evaluating reliability through soft error triggered excepti..:

Aviles, Pablo M. ; Lindoso, Almudena ; Belloch, Jose A..
Microelectronics Reliability.  126 (2021)  - p. 114323 , 2021
Link: https://doi.org/10.1016/..
 
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