E-LIB Suche - Ergebnisse für: Escola, Facundo Zaldivar

1

Adaptive Optical System for Photothermal Microscopy:

Jan, Luis Emiliano ; Escola, Facundo Zaldivar ; Mingolo, Nélida
Microscopy and Microanalysis. 26 (2020) S1 - p. 9-10 , 2020

Link: https://doi.org/10.1017/..

2

Photothermal Microscopy Applied to the Study of Polymer Com..:

Escola, Facundo Zaldivar ; Mingolo, Nélida
Microscopy and Microanalysis. 26 (2020) S1 - p. 137-138 , 2020

Link: https://doi.org/10.1017/..

3

Characterization of absorptance homogeneity in thin-film co..:

Escola, Facundo Zaldivar ; Míngolo, Nélida ; Martínez, Oscar E...
Applied Optics. 58 (2019) 26 - p. 7233 , 2019

Link: https://doi.org/10.1364/..

4

Investigation of laser annealing mechanisms in thin film co..:

Escola, Facundo Zaldivar ; Mingolo, Nélida ; Martínez, Oscar E...
Optics Express. 27 (2019) 4 - p. 5729 , 2019

Link: https://doi.org/10.1364/..

5

Photothermal Microscopy:

Escola, Facundo Zaldivar ; Kunik, Darío ; Martinez, Oscar Eduardo.
Procedia Materials Science. 8 (2015) - p. 665-673 , 2015

Link: https://doi.org/10.1016/..

6

Integral maximisation algorithm. Comparison with standard m..:

Jan, Luis Emiliano ; Zaldivar Escola, Facundo
Measurement Science and Technology. 35 (2024) 7 - p. 075207 , 2024

Link: https://doi.org/10.1088/..

7

Simulations of Layer Effects in Confocal Photothermal Micro..:

Zaldivar Escola, Facundo
Journal of the Optical Society of America B. , 2023

Link: https://doi.org/10.1364/..

8

Photothermal microscopy applied to the study of polymer com..:

Zaldivar Escola, Facundo
Polymer Testing. 84 (2020) - p. 106378 , 2020

Link: https://doi.org/10.1016/..

9

Characterization of Sintered Mixed Oxides by Photothermal M..:

Zaldivar Escola, Facundo ; Kempf, Rodolfo ; Mingolo, Nelida.
International Journal of Thermophysics. 37 (2016) 2 - p. , 2016

Link: https://doi.org/10.1007/..

10

Microscopía fototérmica para el estudio de transformaciones..:

Escola, Facundo Zaldivar ; Martínez, Oscar Eduardo ; Mingolo, Nelly
10.1590/s1517-707620180002.0369. , 2018

Link: http://www.scielo.br/sci..

11

Sistema de medición de error de foco : consideraciones prác..:

Zaldivar Escola, Facundo
https://hdl.handle.net/20.500.12110/afa_v33_n04_p090. , 2023

Link: https://hdl.handle.net/2..

12

Microscopía fototérmica confocal:

Zaldivar Escola, Facundo
https://bibliotecadigital.fi.uba.ar/files/original/35c4d9357516d782917cc9195f25b791.pdf. , 2015

Link: https://bibliotecadigita..

13

Microscopía fototérmica confocal:

Zaldivar Escola, Facundo
http://bibliotecadigital.fi.uba.ar/items/show/19377. , 2015

Link: http://bibliotecadigital..

14

Microscopía fototérmica:

Zaldivar Escola, Facundo ; Jan, Luis Emiliano ; Mingolo, Nelida
info:eu-repo/semantics/altIdentifier/url/https://radi.org.ar/wp-content/uploads/2019/11/RADI-14-OCTUBRE-2019-WEB.pdf. ,

Link: http://hdl.handle.net/11..

15

Investigation of laser annealing mechanisms in thin film co..:

Zaldivar Escola, Facundo ; Mingolo, Nélida ; Martínez, Oscar E..
info:eu-repo/semantics/altIdentifier/url/https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-27-4-5729&id=405099. ,

Link: http://hdl.handle.net/11..