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Evmorfopoulos, Nestor
48  Ergebnisse:
Personensuche X
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1

Electromigration Stress Analysis with Rational Krylov-based..:

, In: 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD),
Stoikos, Pavlos ; Floros, George ; Garyfallou, Dimitrios.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Accurate Soft Error Rate Evaluation Using Event-Driven Dyna..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Paliaroutis, Georgios-Ioannis ; Tsoumanis, Pelopidas ; Garyfallou, Dimitrios... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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3

An Optimal Methodology for EM-Based Hardware Trojan Placeme..:

, In: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS),
Takou, Alexandra ; Axelou, Olympia ; Floros, George.. - p. 25-29 , 2023
Link: https://doi.org/10.1109/..
 
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4

An Efficient Security Closure Methodology for EM-based Atta..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Takou, Alexandra ; Stoikos, Pavlos ; Moysis, Moysis... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Recent Progress in the Analysis of Electromigration and Str..:

, In: Proceedings of the 2023 International Symposium on Physical Design,
Evmorfopoulos, Nestor ; Shohel, Mohammad Abdullah Al ; Axelou, Olympia... - p. 115-123 , 2023
Link: https://dl.acm.org/doi/1..
 
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6

A Fast Semi-Analytical Approach for Transient Electromigrat..:

, In: Proceedings of the 28th Asia and South Pacific Design Automation Conference,
Stoikos, Pavlos ; Floros, George ; Garyfallou, Dimitrios.. - p. 1-6 , 2023
Link: https://dl.acm.org/doi/1..
 
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7

PROTON – A Python Framework for Physics-Based Electromigrat..:

, In: 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD),
Axelou, Olympia ; Tselepi, Eleni ; Floros, George.. - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Frequency-Domain Transient Electromigration Analysis Using ..:

, In: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD),
Al Shohel, Mohammad Abdullah ; Chhabria, Vidya A. ; Evmorfopoulos, Nestor. - p. 1-8 , 2023
Link: https://doi.org/10.1109/..
 
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9

A System Theoretic Approach for the Reduction of Large-Scal..:

, In: 2023 31st European Signal Processing Conference (EUSIPCO),
Axelou, Olympia ; Stoikos, Pavlos ; Floros, George.. - p. 381-385 , 2023
Link: https://doi.org/10.23919..
 
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10

On the Reduction of Large-Scale Room Acoustic Models:

, In: ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP),
Stoikos, Pavlos ; Axelou, Olympia ; Floros, George.. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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11

Fast electromigration stress analysis using Low-Rank Balanc..:

Axelou, Olympia ; Floros, George ; Evmorfopoulos, Nestor.
Integration.  89 (2023)  - p. 197-206 , 2023
Link: https://doi.org/10.1016/..
 
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12

Analysis of the Impact of Electrical and Timing Masking on ..:

Tsoumanis, Pelopidas ; Paliaroutis, Georgios Ioannis ; Evmorfopoulos, Nestor.
Technologies.  10 (2022)  1 - p. 23 , 2022
Link: https://doi.org/10.3390/..
 
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13

Accelerating Electromigration Stress Analysis Using Low-Ran..:

, In: 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD),
Axelou, Olympia ; Floros, George ; Evmorfopoulos, Nestor. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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14

A Novel Semi-Analytical Approach for Fast Electromigration ..:

, In: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design,
Axelou, Olympia ; Evmorfopoulos, Nestor ; Floros, George.. - p. 1-7 , 2022
Link: https://dl.acm.org/doi/1..
 
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15

Statistical Estimation of Leakage Power Bounds in CMOS VLSI..:

, In: 25th Pan-Hellenic Conference on Informatics,
Bountas, Dimitrios ; Evmorfopoulos, Nestor ; Dimitriou, George... - p. 312-317 , 2021
Link: https://dl.acm.org/doi/1..
 
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