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Eyben, P.
89  Ergebnisse:
Personensuche X
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1

Towards Improved Nanosheet-Based Complementary Field Effect..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Chiarella, T. ; Matagne, P. ; Mertens, H.... - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
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2

Comparison of Electrical Performance of Co-Integrated Forks..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Ritzenthaler, R. ; Mertens, H. ; Eneman, G.... - p. 26.2.1-26.2.4 , 2021
Link: https://doi.org/10.1109/..
 
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3

3D-carrier Profiling and Parasitic Resistance Analysis in V..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Eyben, P. ; Machillot, J. ; Kim, M.... - p. 11.3.1-11.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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4

Outwitting the series resistance in scanning spreading resi..:

Schulze, A. ; Cao, R. ; Eyben, P...
Ultramicroscopy.  161 (2016)  - p. 59-65 , 2016
Link: https://doi.org/10.1016/..
 
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5

Insights into the nanoscale lateral and vertical phase sepa..:

Chintala, R. ; Tait, J. G. ; Eyben, P....
Nanoscale.  8 (2016)  6 - p. 3629-3637 , 2016
Link: https://doi.org/10.1039/..
 
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6

On the effects of a pressure induced amorphous silicon laye..:

Coq Germanicus, R. ; Leclère, Ph. ; Guhel, Y....
Journal of Applied Physics.  117 (2015)  24 - p. , 2015
Link: https://doi.org/10.1063/..
 
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7

Overcoated diamond tips for nanometer-scale semiconductor d..:

Hantschel, T. ; Tsigkourakos, M. ; Kluge, J....
Microelectronic Engineering.  141 (2015)  - p. 1-5 , 2015
Link: https://doi.org/10.1016/..
 
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8

Diamond nanoprobes for electrical probing of nanoelectronic..:

Hantschel, T. ; Clarysse, T. ; Ajaykumar, A....
Microelectronic Engineering.  121 (2014)  - p. 19-23 , 2014
Link: https://doi.org/10.1016/..
 
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9

Selective metal-organic chemical vapor deposition growth of..:

Guo, W. ; Date, L. ; Pena, V....
Applied Physics Letters.  105 (2014)  6 - p. , 2014
Link: https://doi.org/10.1063/..
 
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10

Electrical properties of amino SAM layers studied with cond..:

Chintala, R. ; Eyben, P. ; Armini, S....
European Polymer Journal.  49 (2013)  8 - p. 1952-1956 , 2013
Link: https://doi.org/10.1016/..
 
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11

Quantitative three-dimensional carrier mapping in nanowire-..:

Schulze, A. ; Hantschel, T. ; Eyben, P....
Ultramicroscopy.  125 (2013)  - p. 18-23 , 2013
Link: https://doi.org/10.1016/..
 
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12

Nanoprober-based EBIC measurements for nanowire transistor ..:

Arstila, K. ; Hantschel, T. ; Schulze, A....
Microelectronic Engineering.  105 (2013)  - p. 99-102 , 2013
Link: https://doi.org/10.1016/..
 
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13

Selective Area Growth of InP on On-Axis Si(001) Substrates ..:

Loo, R. ; Wang, G. ; Orzali, T....
Journal of The Electrochemical Society.  159 (2012)  3 - p. H260-H265 , 2012
Link: https://doi.org/10.1149/..
 
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14

TiN scanning probes for electrical profiling of nanoelectro..:

Hantschel, T. ; Schulze, A. ; Celano, U....
Microelectronic Engineering.  97 (2012)  - p. 255-258 , 2012
Link: https://doi.org/10.1016/..
 
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15

Dopant and carrier profiling in FinFET-based devices with s..:

, In: 2010 Symposium on VLSI Technology,
Mody, J. ; Kambham, A.K. ; Zschatzsch, G.... - p. 195-196 , 2010
Link: https://doi.org/10.1109/..
 
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