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Fadaeinia, Bijan
9  Ergebnisse:
Personensuche X
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1

Does Aging Matter? The Curious Case of Fault Sensitivity An..:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Ebrahimabadi, Mohammad ; Fadaeinia, Bijan ; Moradi, Amir. - p. 84-89 , 2022
Link: https://doi.org/10.1109/..
 
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2

On the Impact of Aging on Power Analysis Attacks Targeting ..:

, In: Proceedings of the 26th Asia and South Pacific Design Automation Conference,
Anik, Md Toufiq Hasan ; Fadaeinia, Bijan ; Moradi, Amir. - p. 414-420 , 2021
Link: https://dl.acm.org/doi/1..
 
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3

Masked SABL: A Long Lasting Side-Channel Protection Design ..:

Fadaeinia, Bijan ; Hasan Anik, Md Toufiq ; Karimi, Naghmeh.
IEEE Access.  9 (2021)  - p. 90455-90464 , 2021
Link: https://doi.org/10.1109/..
 
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4

3-Phase Adiabatic Logic and its Sound SCA Evaluation:

Fadaeinia, Bijan ; Moradi, Amir
IEEE Transactions on Emerging Topics in Computing.  9 (2021)  4 - p. 2175-2188 , 2021
Link: https://doi.org/10.1109/..
 
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5

Balancing the Leakage Currents in Nanometer CMOS Logic—A Ch..:

Fadaeinia, Bijan ; Moos, Thorben ; Moradi, Amir
Applied Sciences.  11 (2021)  15 - p. 7143 , 2021
Link: https://doi.org/10.3390/..
 
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6

Balancing the leakage currents in nanometer CMOS logic:

Fadaeinia, Bijan ; Moos, Thorben (Dr.-Ing.) ; Moradi, Amir (Prof. Dr.-Ing.)
https://hss-opus.ub.ruhr-uni-bochum.de/opus4/frontdoor/index/index/docId/8504.  , 2021
Link: https://hss-opus.ub.ruhr..
 
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7

Balancing the Leakage Currents in Nanometer CMOS Logic—A Ch..:

Bijan Fadaeinia ; Thorben Moos ; Amir Moradi
Electrical, Electronics and Communications Engineering.  , 2021
Link: https://doi.org/10.3390/..
 
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8

Masked SABL: A Long Lasting Side-Channel Protection Design ..:

Bijan Fadaeinia ; Md Toufiq Hasan Anik ; Naghmeh Karimi.
https://ieeexplore.ieee.org/document/9460963/.  , 2021
Link: https://doi.org/10.1109/..
 
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9

Balancing the Leakage Currents in Nanometer CMOS Logic—A Ch..:

Bijan Fadaeinia ; Thorben Moos ; Amir Moradi
https://www.mdpi.com/2076-3417/11/15/7143.  , 2021
Link: https://doi.org/10.3390/..
 
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