Failor, B.
65  Ergebnisse:
Personensuche X
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2

Diagnostic systems for the National Ignition Facility (NIF)..:

Kilkenny, J. D. ; Cable, M. D. ; Clower, C. A....
Review of Scientific Instruments.  66 (1995)  1 - p. 288-295 , 1995
 
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3

Argon And Krypton Gas Puff Z-pinch Implosions at 3.5 MA:

, In: IEEE Conference Record - Abstracts. 1992 IEEE International Conference on Plasma,
Deeney, C. ; LePell, P.D. ; Failor, B.... - p. 156 , 1992
 
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4

Comparison of fission signatures from β− delayed γ-ray and ..:

Cárdenas, E.S. ; Reedy, E.T.E. ; Seipel, H.A...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  792 (2015)  - p. 67-73 , 2015
 
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5

Sensitivity of an image plate system in the XUV (60 eV < E ..:

Failor, B H ; Gullikson, E M ; Link, N G..
Journal of Instrumentation.  7 (2012)  4 - p. P04011-P04011 , 2012
 
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6

Proof-of-Principle Time-Resolved Bremsstrahlung Spectral Me..:

Failor, B H ; Riordan, J C ; Rodriguez, J C..
Journal of Instrumentation.  4 (2009)  3 - p. P03007-P03007 , 2009
 
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9

Time Dependent Axial Z-pinch Characterization of Argon PRS ..:

, In: 2007 IEEE 34th International Conference on Plasma Science (ICOPS),
Thompson, J. R. ; Coleman, P. L. ; Jarema, A.... - p. None , 2007
 
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10

Long-Implosion-Time, 12-cm-Diameter Argon-Gas-Puff Experime..:

, In: 2007 IEEE 34th International Conference on Plasma Science (ICOPS),
Commisso, R.J. ; Apruzese, J.P. ; Davis, J.... - p. None , 2007
 
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11

X-ray framing camera for pulsed, high current, electron bea..:

Failor, B H ; Rodriguez, J C ; Riordan, J C.
Journal of Instrumentation.  2 (2007)  7 - p. P07001-P07001 , 2007
 
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13

K and XUV signatures of high K-yieldstructured AR puff load:

, In: The 33rd IEEE International Conference on Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts.,
Lojewski, D. Y. ; Velikovich, A.L. ; Thornhill, J.W.... - p. 400-400 , 2006
 
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14

Bent-crystal Laue spectrograph for measuring x-ray spectra ..:

Failor, B. H. ; Wong, S. ; Riordan, J. C....
Review of Scientific Instruments.  77 (2006)  10 - p. , 2006
 
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