Faqir, M.
~ 200  Ergebnisse:
Personensuche X
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1

An analytical model to calculate the current–voltage charac..:

Tijent, F. Z. ; Faqir, M. ; Voss, P. L...
Journal of Computational Electronics.  21 (2022)  3 - p. 644-653 , 2022
 
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3

Prediction of the impact of friction's coefficient in cylin..:

Bouchaâla, K ; Ghanameh, M F ; Faqir, M..
IOP Conference Series: Materials Science and Engineering.  664 (2019)  1 - p. 012004 , 2019
 
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4

Fabrication, assembly and testing of a glass interposer-bas..:

El Amrani, A. ; Demir, K. ; Bouya, M....
Microelectronic Engineering.  165 (2016)  - p. 6-10 , 2016
 
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5

Analytical and finite element modeling of through glass via..:

Benali, A. ; Faqir, M. ; Bouya, M...
Microelectronic Engineering.  151 (2016)  - p. 12-18 , 2016
 
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6

A study of through package vias in a glass interposer for m..:

El Amrani, A. ; Benali, A. ; Bouya, M....
Microelectronics Reliability.  54 (2014)  9-10 - p. 1972-1976 , 2014
 
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7

Improved thermal management for GaN power electronics: Silv..:

Faqir, M. ; Batten, T. ; Mrotzek, T....
Microelectronics Reliability.  52 (2012)  12 - p. 3022-3025 , 2012
 
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8

Analysis of current collapse effect in AlGaN/GaN HEMT: Expe..:

Faqir, M. ; Bouya, M. ; Malbert, N....
Microelectronics Reliability.  50 (2010)  9-11 - p. 1520-1522 , 2010
 
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9

False surface-trap signatures induced by buffer traps in Al..:

, In: 2009 IEEE International Reliability Physics Symposium,
Verzellesi, G. ; Faqir, M. ; Chini, A.... - p. None , 2009
 
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10

Characterization and analysis of trap-related effects in Al..:

Faqir, M. ; Verzellesi, G. ; Fantini, F....
Microelectronics Reliability.  47 (2007)  9-11 - p. 1639-1642 , 2007
 
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13

Fabrication of Geopolymers from Untreated Kaolin Clay for C..:

Faqir, Naim M. ; Shawabkeh, Reyad ; Al-Harthi, Mamdouh.
Geotechnical and Geological Engineering.  37 (2018)  1 - p. 129-137 , 2018
 
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