Fedison, J. B.
11  Ergebnisse:
Personensuche X
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1

Partial dislocations and stacking faults in 4H-SiC PiN diod..:

Twigg, M. E. ; Stahlbush, R. E. ; Fatemi, M....
Journal of Electronic Materials.  33 (2004)  5 - p. 472-476 , 2004
 
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4

Stacking-fault formation and propagation in 4H-SiC PiN diod..:

Stahlbush, R. E. ; Fatemi, M. ; Fedison, J. B....
Journal of Electronic Materials.  31 (2002)  7 - p. 827-827 , 2002
 
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5

Stacking-fault formation and propagation in 4H-SiC PiN diod..:

Stahlbush, R. E. ; Fatemi, M. ; Fedison, J. B....
Journal of Electronic Materials.  31 (2002)  5 - p. 370-375 , 2002
 
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6

Electrical characteristics of magnesium-doped gallium nitri..:

Fedison, J. B. ; Chow, T. P. ; Lu, H..
Applied Physics Letters.  72 (1998)  22 - p. 2841-2843 , 1998
 
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7

Reactive Ion Etching of GaN in BCl3 /  N 2 Plasmas:

Fedison, J. B. ; Chow, T. P. ; Lu, H..
Journal of The Electrochemical Society.  144 (1997)  8 - p. L221-L224 , 1997
 
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10

Al/C/B Co-Implanted High-Voltage 4H-SiC PiN Junction Rectif..:

Fedison, Jeffery B. ; Li, Z. ; Khemka, V....
Materials Science Forum.  338-342 (2000)  - p. 1367-1370 , 2000
 
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