Fell, Jonas
59  Ergebnisse:
Personensuche X
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1

Three-dimensional characterization of abrasive chips using ..:

Fang, Shiqi ; Fell, Jonas ; Frank, Alexander...
The International Journal of Advanced Manufacturing Technology.  133 (2024)  9-10 - p. 4651-4662 , 2024
 
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4

Three-dimensional imaging of microstructural evolution in S..:

Fell, Jonas ; Pauly, Christoph ; Maisl, Michael...
Tomography of Materials and Structures.  2 (2023)  - p. 100009 , 2023
 
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6

A FIB-SEM Based Correlative Methodology for X-Ray Nanotomog..:

Cressa, Luca ; Fell, Jonas ; Pauly, Christoph...
Microscopy and Microanalysis.  28 (2022)  6 - p. 1890-1895 , 2022
 
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8

Combining X-ray Nano Tomography with focused ion beam seria..:

Lutter, Fabian ; Stahlhut, Philipp ; Dremel, Kilian...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  500-501 (2021)  - p. 10-17 , 2021
 
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