E-LIB Suche - Ergebnisse für: Ferlet-Cavrois, V

1

Energy Deposition by Ultrahigh Energy Ions in Large and Sma..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science. 69 (2022) 3 - p. 241-247 , 2022

Link: https://doi.org/10.1109/..

2

Secondary Particles Generated by Protons in 3-D nand Flash ..:

Bagatin, M. ; Gerardin, S. ; Paccagnella, A....
IEEE Transactions on Nuclear Science. 69 (2022) 7 - p. 1461-1466 , 2022

Link: https://doi.org/10.1109/..

3

Space Environment & Effects Satellite (SE&ES) Mission Conce..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),

Jiggens, P. ; Vennekens, J. ; Lux, P.... - p. 1-4 , 2021

Link: https://doi.org/10.1109/..

4

SEE evaluation of ARM M0 cores in a 28 nm FDSOI technology:

Shi, S.-T. ; Liu, R. ; Evans, A....
Microelectronics Reliability. 123 (2021) - p. 114214 , 2021

Link: https://doi.org/10.1016/..

5

Laser-plasma-based Space Radiation Reproduction in the Labo..:

Hidding, B. ; Karger, O. ; Königstein, T....
Scientific Reports. 7 (2017) 1 - p. , 2017

Link: https://doi.org/10.1038/..

6

Analysis of heavy-ion induced charge collection mechanisms ..:

Schwank, J.R ; Ferlet-Cavrois, V ; Dodd, P.E...
Solid-State Electronics. 48 (2004) 6 - p. 1027-1044 , 2004

Link: https://doi.org/10.1016/..

7

Worst-case bias during total dose irradiation of SOI transi..:

Ferlet-Cavrois, V. ; Colladant, T. ; Paillet, P....
IEEE Transactions on Nuclear Science. 47 (2000) 6 - p. 2183-2188 , 2000

Link: https://doi.org/10.1109/..

8

Correlation between Co-60 and X-ray radiation-induced charg..:

Schwank, J.R. ; Shaneyfelt, M.R. ; Dodd, P.E....
IEEE Transactions on Nuclear Science. 47 (2000) 6 - p. 2175-2182 , 2000

Link: https://doi.org/10.1109/..

9

Designing MOS/SOI transistors for high frequency and low vo..:

Ferlet-Cavrois, V. ; Bracale, A. ; Marcandella, C....
Microelectronic Engineering. 48 (1999) 1-4 - p. 351-354 , 1999

Link: https://doi.org/10.1016/..

10

Application of an ion microbeam to determine the radial car..:

Musseau, O ; Ferlet-Cavrois, V ; Campbell, A.B...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 146 (1998) 1-4 - p. 607-612 , 1998

Link: https://doi.org/10.1016/..

11

Rapid annealing measurements in fully-depleted NMOS/SOI:

Gruber, O. ; Ferlet-Cavrois, V. ; Paillet, Ph....
Microelectronic Engineering. 36 (1997) 1-4 - p. 249-252 , 1997

Link: https://doi.org/10.1016/..

12

Simulations of hardened components and circuits:

DURBIN, F. ; FERLET-CAVROIS, V. ; HAUSSY, J...
International Journal of Electronics. 81 (1996) 2 - p. 125-136 , 1996

Link: https://doi.org/10.1080/..

13

Single Event Effects in 3D NAND Flash Memory Cells with Rep..:

Bagatin M ; Gerardin S ; Paccagnella A...
firstpage:1. , 2022

Link: https://hdl.handle.net/1..

14

Direct Ionization Impact on Accelerator Mixed-Field Soft Er..:

Alía, R. G ; Tali, M ; Brugger, M...
IEEE Transactions on Nuclear Science. , 2020

Link: http://urn.fi/URN:NBN:fi..

15

Single-Event Effects in the Peripheral Circuitry of a Comme..:

Bosser, Alexandre ; Gupta, V ; Javanainen, Arto...
IEEE Transactions on Nuclear Science. , 2018

Link: http://urn.fi/URN:NBN:fi..