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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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Bitstream- Level Interconnect Fault Characterization for SR..:
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2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) ,
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Characterization of Interconnect Fault Effects in SRAM-base..:
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2020 15th Conference on Computer Science and Information Systems (FedCSIS) ,
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