E-LIB Suche - Ergebnisse für: Fichtner, Wolfgang

1

Quantitative anorganische Analyse

Leitfaden zum Praktikum Springer-Lehrbuch

Lux, Hermann ; Fichtner, Wolfgang - 9., neubearb. Aufl. . , 1992

Exemplare: Zentrale;

2

Synthesen, Charakterisierung und Reaktionen von Übergangsm..

Minerva-Fachserie Naturwissenschaften

Fichtner, Wolfgang , 1981

Exemplare: Zentrale;

3

A new process simulator for the optimization of electron be..:

Mangiacapra, Luigi ; Ciappa, Mauro ; Stangoni, Maria..
Radiation Physics and Chemistry. 84 (2013) - p. 119-125 , 2013

Link: https://doi.org/10.1016/..

4

Electro-thermal simulation in the time domain of GaN HEMT f..:

Ono, Satoshi ; Ciappa, Mauro ; Hiura, Shigeru.
Microelectronics Reliability. 52 (2012) 9-10 - p. 2224-2227 , 2012

Link: https://doi.org/10.1016/..

5

Synthesis of scanning electron microscopy images by high pe..:

Esposito, Aniello ; Ciappa, Mauro ; Fichtner, Wolfgang
Microelectronics Reliability. 51 (2011) 9-11 - p. 1673-1678 , 2011

Link: https://doi.org/10.1016/..

6

Atomistic nanoelectronic device engineering with sustained ..:

, In: Proceedings of 2011 International Conference for High Performance Computing, Networking, Storage and Analysis,

Luisier, Mathieu ; Boykin, Timothy B. ; Klimeck, Gerhard. - p. 1-11 , 2011

Link: https://dl.acm.org/doi/1..

7

A new built-in screening methodology for Successive Approxi..:

Malandruccolo, Vezio ; Ciappa, Mauro ; Rothleitner, Hubert..
Microelectronics Reliability. 50 (2010) 9-11 - p. 1750-1757 , 2010

Link: https://doi.org/10.1016/..

8

A New Built-In Defect-Based Testing Technique to Achieve Ze..:

Malandruccolo, Vezio ; Ciappa, Mauro ; Rothleitner, Hubert.
Journal of Electronic Testing. 27 (2010) 1 - p. 19-30 , 2010

Link: https://doi.org/10.1007/..

9

Modeling secondary electron images for linewidth measuremen..:

Ciappa, Mauro ; Koschik, Alexander ; Dapor, Maurizio.
Microelectronics Reliability. 50 (2010) 9-11 - p. 1407-1412 , 2010

Link: https://doi.org/10.1016/..

10

Accurate extraction of the mechanical properties of thin fi..:

Sasaki, Yuji ; Ciappa, Mauro ; Masunaga, Takayuki.
Microelectronics Reliability. 50 (2010) 9-11 - p. 1621-1625 , 2010

Link: https://doi.org/10.1016/..

11

Ab initiocalculations of arsenic in silicon: Diffusion mech..:

Vollenweider, Kilian ; Sahli, Beat ; Fichtner, Wolfgang
Physical Review B. 81 (2010) 17 - p. , 2010

Link: https://doi.org/10.1103/..

12

VLSI implementations of the cryptographic hash functions MD..:

, In: 2009 IEEE International Symposium on Circuits and Systems (ISCAS),

Henzen, L. ; Carbognani, F. ; Aumassony, J.-Ph... - p. None , 2009

Link: https://doi.org/10.1109/..

13

A new built-in screening methodology to achieve zero defect..:

Malandruccolo, Vezio ; Ciappa, Mauro ; Rothleitner, Hubert.
Microelectronics Reliability. 49 (2009) 9-11 - p. 1334-1340 , 2009

Link: https://doi.org/10.1016/..

14

Ab InitioStudy of Fluorine in Silicon: Large Clusters and t..:

Vollenweider, Kilian ; Sahli, Beat ; Fichtner, Wolfgang
Physical Review Letters. 103 (2009) 7 - p. , 2009

Link: https://doi.org/10.1103/..

15

Ensuring the reliability of electron beam crosslinked elect..:

Ciappa, Mauro ; Mangiacapra, Luigi ; Stangoni, Maria..
Microelectronics Reliability. 49 (2009) 9-11 - p. 972-976 , 2009

Link: https://doi.org/10.1016/..