Filicori, Fabio
27  Ergebnisse:
Personensuche X
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1

Stability Characterizing Function for Electronic Circuit De..:

Santarelli, Alberto ; Pantoli, Leonardo ; Leuzzi, Giorgio.
IEEE Transactions on Microwave Theory and Techniques.  72 (2024)  3 - p. 1536-1550 , 2024
 
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2

An electromagnetic method for measuring AC losses in HTS ta..:

Breschi, Marco ; Filicori, Fabio ; Musso, Andrea.
Journal of Physics: Conference Series.  1559 (2020)  1 - p. 012066 , 2020
 
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3

M2S parameters: a Multi-Tone Multi-Harmonic Measurement App..:

, In: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
 
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4

Automatic Extraction of Measurement-Based Large-Signal FET ..:

Martin-Guerrero, Teresa M. ; Santarelli, Alberto ; Gibiino, Gian Piero...
IEEE Transactions on Microwave Theory and Techniques.  68 (2020)  5 - p. 1627-1636 , 2020
 
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5

Charge-conservative GaN HEMT nonlinear modeling from non-is..:

Gibiino, Gian Piero ; Santarelli, Alberto ; Filicori, Fabio
International Journal of Microwave and Wireless Technologies.  11 (2019)  5-6 - p. 431-440 , 2019
 
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7

New pulsed measurement setup for GaN and GaAs FETs characte..:

Santarelli, Alberto ; Cignani, Rafael ; Niessen, Daniel..
International Journal of Microwave and Wireless Technologies.  4 (2012)  3 - p. 387-397 , 2012
 
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10

Nonlinear modeling of InP devices for W-band applications:

Resca, Davide ; Di Giacomo, Valeria ; Raffo, Antonio...
International Journal of Microwave and Wireless Technologies.  1 (2009)  2 - p. 145-151 , 2009
 
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11

Behavioral modeling and linearization of a millimeter-wave ..:

Melczarsky, Ilan ; Gilabert, Pere L. ; Di Giacomo, Valeria..
International Journal of Microwave and Wireless Technologies.  1 (2009)  2 - p. 127-136 , 2009
 
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