Firrincieli, Vincent
7  Ergebnisse:
Personensuche X
?
3

Characterization of GeSn materials for future Ge pMOSFETs s..:

Vincent, B. ; Shimura, Y. ; Takeuchi, S....
Microelectronic Engineering.  88 (2011)  4 - p. 342-346 , 2011
 
1-7