E-LIB Suche - Ergebnisse für: Flandre, Denis

1

Variability-Aware Noise-Induced Dynamic Instability of Ultr..:

, In: 2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS),

Van Brandt, Leopold ; Delvenne, Jean-Charles ; Flandre, Denis - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

2

Impact of passivation layer on the subthreshold behavior of..:

Chen, Qi ; Zeng, Xi ; Flandre, Denis
Solid-State Electronics. 214 (2024) - p. 108878 , 2024

Link: https://doi.org/10.1016/..

3

Membrane‐based mechanical characterization of screen‐printe..:

Masarweh, Eléonore ; Arseenko, Mariia ; Guaino, Philippe.
Applied Research. , 2024

Link: https://doi.org/10.1002/..

4

A Combined Analytical and Simulation-Based Methodology for ..:

Favresse, Sylvain ; Bol, David ; Flandre, Denis
IEEE Transactions on Circuits and Systems I: Regular Papers. , 2024

Link: https://doi.org/10.1109/..

5

Compositional Engineering of Cu-Doped SnO Film for Compleme..:

Hong, Ruohao ; He, Penghui ; Zhang, Sen...
Nano Letters. 24 (2024) 4 - p. 1176-1183 , 2024

Link: https://doi.org/10.1021/..

6

Li‐Doping and Ag‐Alloying Interplay Shows the Pathway for K..:

Gong, Yuancai ; Jimenez‐Arguijo, Alex ; Medaille, Axel Gon...
Advanced Functional Materials. , 2024

Link: https://doi.org/10.1002/..

7

Stochastic Nonlinear Dynamical Modelling of SRAM Bitcells i..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Van Brandt, Leopold ; Flandre, Denis ; Delvenne, Jean-Charles - p. 1-3 , 2024

Link: https://doi.org/10.1109/..

8

Printed-Board Inductive Loop Topologies Performance for Par..:

Imburgia, Antonino ; Kaziz, Sinda ; Romano, Pietro...
IEEE Transactions on Industry Applications. 60 (2024) 4 - p. 5655-5662 , 2024

Link: https://doi.org/10.1109/..

9

Tuning the Intrinsic Stochasticity of Resistive Switching i..:

Bidoul, Noémie ; Roisin, Nicolas ; Flandre, Denis
Nano Letters. 24 (2024) 21 - p. 6201-6209 , 2024

Link: https://doi.org/10.1021/..

10

SPICE Model of SPAD Transient Intrinsic Response Validated ..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),

Klauner, Tom ; Alirezaei, Iman Sabri ; Roisin, Nicolas.. - p. 136-139 , 2023

Link: https://doi.org/10.1109/..

11

A 1.1-/0.9-nA Temperature-Independent 213-/565-ppm/°C Self-..:

Lefebvre, Martin ; Flandre, Denis ; Bol, David
IEEE Journal of Solid-State Circuits. 58 (2023) 8 - p. 2239-2251 , 2023

Link: https://doi.org/10.1109/..

12

Effect of Silicon Substrate Resistivity on Large-Area High ..:

, In: 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP),

Zeidi, Najeh ; Rack, Martin ; Andre, Nicolas... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

13

Static and Dynamic Stochastic Analysis of a Temperature-Sen..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),

Bidoul, Noemie ; Rosca, Teodor ; Ionescu, Adrian M.. - p. 81-84 , 2023

Link: https://doi.org/10.1109/..

14

On noise-induced transient bit flips in subthreshold SRAM:

Van Brandt, Léopold ; Silveira, Fernando ; Delvenne, Jean-Charles.
Solid-State Electronics. 208 (2023) - p. 108715 , 2023

Link: https://doi.org/10.1016/..

15

Analysis and Design of RF Energy-Harvesting Systems With Im..:

Xu, Pengcheng ; Flandre, Denis ; Bol, David
IEEE Transactions on Circuits and Systems II: Express Briefs. 70 (2023) 2 - p. 361-365 , 2023

Link: https://doi.org/10.1109/..