E-LIB Suche - Ergebnisse für: Franta, Daniel

1

Optical Characterization of Inhomogeneous Thin Films Deposi..:

Dvořák, Jan ; Vohánka, Jiří ; Buršíková, Vilma..
Coatings. 13 (2023) 5 - p. 873 , 2023

Link: https://doi.org/10.3390/..

2

Optical Characterization of Gadolinium Fluoride Films Using..:

Franta, Daniel ; Vohánka, Jiří ; Dvořák, Jan...
Coatings. 13 (2023) 2 - p. 218 , 2023

Link: https://doi.org/10.3390/..

3

Dispersion models exhibiting natural optical activity: appl..:

Hroncová, Beáta ; Franta, Daniel ; Dvorak, Jan.
Journal of the Optical Society of America B. , 2023

Link: https://doi.org/10.1364/..

4

Wide spectral range optical characterization of yttrium alu..:

Franta, Daniel ; Mureșan, Mihai-George
Optical Materials Express. 11 (2021) 12 - p. 3930 , 2021

Link: https://doi.org/10.1364/..

5

Constitutive equations describing optical activity in theor..:

Franta, Daniel ; Vohánka, Jiří
Journal of the Optical Society of America B. 38 (2021) 2 - p. 553 , 2021

Link: https://doi.org/10.1364/..

6

Symmetry of linear dielectric response tensors: Dispersion ..:

Franta, Daniel
Journal of Applied Physics. 127 (2020) 22 - p. , 2020

Link: https://doi.org/10.1063/..

7

Determining shape of thickness non-uniformity using variabl..:

Vohánka, Jiří ; Šustek, Štěpán ; Buršíková, Vilma...
Applied Surface Science. 534 (2020) - p. 147625 , 2020

Link: https://doi.org/10.1016/..

8

Ellipsometric characterization of highly non-uniform thin f..:

Vohánka, Jiří ; Franta, Daniel ; Čermák, Martin...
Optics Express. 28 (2020) 4 - p. 5492 , 2020

Link: https://doi.org/10.1364/..

9

Approximate methods for the optical characterization of inh..:

Ohlídal, Ivan ; Vohánka, Jiří ; Franta, Daniel...
Journal of Electrical Engineering. 70 (2019) 7 - p. 16-26 , 2019

Link: https://doi.org/10.2478/..

10

Approximations of reflection and transmission coefficients ..:

Ohlídal, Ivan ; Vohánka, Jiří ; Mistrík, Jan...
Thin Solid Films. 692 (2019) - p. 137189 , 2019

Link: https://doi.org/10.1016/..

11

Spectroscopic ellipsometry of inhomogeneous thin films exhi..:

Ohlídal, Ivan ; Vohánka, Jiří ; Buršíková, Vilma..
Optics Express. 28 (2019) 1 - p. 160 , 2019

Link: https://doi.org/10.1364/..

12

Optical Characterization of Non-Stoichiometric Silicon Nitr..:

Vohánka, Jiří ; Ohlídal, Ivan ; Ohlídal, Miloslav...
Coatings. 9 (2019) 7 - p. 416 , 2019

Link: https://doi.org/10.3390/..

13

Temperature dependent dispersion models applicable in solid..:

Franta, Daniel ; Vohánka, Jiří ; Čermák, Martin..
Journal of Electrical Engineering. 70 (2019) 7 - p. 1-15 , 2019

Link: https://doi.org/10.2478/..

14

Use of the Richardson extrapolation in optics of inhomogene..:

Vohánka, Jiří ; Ohlídal, Ivan ; Ženíšek, Jaroslav...
Surface and Interface Analysis. 50 (2018) 7 - p. 757-765 , 2018

Link: https://doi.org/10.1002/..

15

Determination of thicknesses and temperatures of crystallin..:

Franta, Daniel ; Franta, Pavel ; Vohánka, Jiří..
Journal of Applied Physics. 123 (2018) 18 - p. , 2018

Link: https://doi.org/10.1063/..