Frickenstein, Alexander
33  Ergebnisse:
Personensuche X
?
1

Adversarial Robustness of Multi-bit Convolutional Neural Ne..:

, In: Lecture Notes in Networks and Systems; Intelligent Systems and Applications,
 
?
2

Wino Vidi Vici: Conquering Numerical Instability of 8-bit W..:

, In: 2024 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
 
?
3

The ZuSE-KI-Mobil AI Accelerator SoC: Overview and a Functi..:

, In: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
?
 
?
5

Accelerating and pruning CNNs for semantic segmentation on ..:

, In: Proceedings of the 59th ACM/IEEE Design Automation Conference,
 
?
7

HW-FlowQ: A Multi-Abstraction Level HW-CNN Co-design Quanti..:

Fasfous, Nael ; Vemparala, Manoj Rohit ; Frickenstein, Alexander...
ACM Transactions on Embedded Computing Systems (TECS).  20 (2021)  5s - p. 1-25 , 2021
 
?
8

BreakingBED: Breaking Binary and Efficient Deep Neural Netw..:

, In: Lecture Notes in Networks and Systems; Intelligent Systems and Applications,
 
?
9

L2PF - Learning to Prune Faster:

, In: Communications in Computer and Information Science; Computer Vision and Image Processing,
 
?
10

HW-FlowQ: A Multi-Abstraction Level HW-CNN Co-design Quanti..:

Fasfous, Nael ; Vemparala, Manoj Rohit ; Frickenstein, Alexander...
ACM Transactions on Embedded Computing Systems.  20 (2021)  5s - p. 1-25 , 2021
 
?
11

ALF : autoencoder-based low-rank filter-sharing for effi..:

, In: Proceedings of the 57th ACM/EDAC/IEEE Design Automation Conference,
 
?
12

ALF: Autoencoder-based Low-rank Filter-sharing for Efficien..:

, In: 2020 57th ACM/IEEE Design Automation Conference (DAC),
 
?
13

Binary DAD-Net: Binarized Driveable Area Detection Network ..:

, In: 2020 IEEE International Conference on Robotics and Automation (ICRA),
 
?
14

OrthrusPE: Runtime Reconfigurable Processing Elements for B..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
?
15

OrthrusPE : runtime reconfigurable processing elements f..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
 
1-15