Fukuhara, Makoto
305  Ergebnisse:
Personensuche X
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1

Stability evaluation of the existing building based on eart..:

Tao, Shangning ; Wang, Lin ; Hashimoto, Kazuyoshi.
Japanese Geotechnical Society Special Publication.  10 (2024)  36 - p. 1359-1364 , 2024
 
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3

A Risk Evaluation Method of Unstable Slopes Using Multipoin..:

, In: Progress in Landslide Research and Technology, Volume 2 Issue 1, 2023; Progress in Landslide Research and Technology,
Fukuhara, Makoto ; Wang, Lin ; Tao, Shangning... - p. 237-246 , 2023
 
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5

An EWS of Landslide and Slope Failure by MEMS Tilting Senso..:

, In: Understanding and Reducing Landslide Disaster Risk; ICL Contribution to Landslide Disaster Risk Reduction,
Wang, Lin ; Fukuhara, Makoto ; Uchimura, Taro.. - p. 295-305 , 2020
 
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6

Effects of soil moisture and shear deformation on elastic w..:

Tao, Shangning ; Uchimura, Taro ; Fukuhara, Makoto.
Japanese Geotechnical Society Special Publication.  8 (2020)  8 - p. 311-318 , 2020
 
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8

Fabrication of Magnetic Nanodots Array Using UV Nanoimprint..:

Shinohara, Hidetoshi ; Fukuhara, Makoto ; Hirasawa, Tamano..
Journal of Photopolymer Science and Technology.  21 (2008)  4 - p. 591-596 , 2008
 
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9

Fabrication of metallic nanopatterns using the vacuum type ..:

Fukuhara, Makoto ; Mizuno, Jun ; Saito, Mikiko..
IEEJ Transactions on Electrical and Electronic Engineering.  2 (2007)  3 - p. , 2007
 
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10

UV Nanoimprint Lithography and Its Application for Nanodevi..:

Fukuhara, Makoto ; Ono, Hiroshi ; Hirasawa, Tamano...
Journal of Photopolymer Science and Technology.  20 (2007)  4 - p. 549-554 , 2007
 
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14

Neural network CT image reconstruction method for small amo..:

Ma, Xiao Feng ; Fukuhara, Makoto ; Takeda, Tatsuoki
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  449 (2000)  1-2 - p. 366-377 , 2000
 
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15

Fabrication of metallic nanopatterns using the vacuum type ..:

Fukuhara Non‐member, Makoto ; Mizuno, Jun ; Saito, Mikiko..
IEEJ Transactions on Electrical and Electronic Engineering.  2 (2007)  3 - p. 307-312 , 2007
 
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